參數(shù)資料
型號: IC61LV2568
英文描述: 256K x 8 Hight Speed SRAM with 3.3V
中文描述: 256K × 8 Hight高速SRAM與3.3V
文件頁數(shù): 5/9頁
文件大小: 252K
代理商: IC61LV2568
IC61LV2568
Integrated Circuit Solution, Inc.
AHSR023-0A
09/12/2001
5
AC TEST LOADS
Figure 1.
Figure 2.
AC TEST CONDITIONS
Parameter
Input Pulse Level
Input Rise and Fall Times
Input and Output Timing
and Reference Levels
Output Load
Unit
0V to 3.0V
3 ns
1.5V
See Figures 1 and 2
Notes:
1. The Vcc operating range for 8 ns is 3.3V +10%, -5%.
READ CYCLE SWITCHING CHARACTERISTICS
(1)
(Over Operating Range)
-8 ns
-10 ns
Min. Max.
-12 ns
Min. Max.
-15 ns
Min. Max.
Symbol
t
RC
t
AA
t
OHA
t
ACE
t
DOE
t
LZOE
(2)
t
HZOE
(2)
t
LZCE
(2)
t
HZCE
(2)
Parameter
Min. Max.
Unit
Read Cycle Time
8
10
12
15
ns
Address Access Time
8
10
12
15
ns
Output Hold Time
3
3
3
3
ns
CE
Access Time
8
10
12
15
ns
OE
Access Time
3
4
5
6
ns
OE
to Low-Z Output
0
0
0
0
ns
OE
to High-Z Output
0
3
0
4
0
5
0
6
ns
CE
to Low-Z Output
3
3
3
3
ns
CE
to High-Z Output
0
3
0
4
0
5
0
6
ns
Notes:
1. Test conditions assume signal transition times of 3 ns or less, timing reference levels of 1.5V,
input pulse levels of 0 to 3.0V and output loading specified in Figure 1.
2. Tested with the load in Figure 2. Transition is measured ±200 mV from steady-state voltage. Not
100% tested.
319
30 pF
Including
jig and
scope
353
OUTPUT
3.3V
319
5 pF
Including
jig and
scope
353
OUTPUT
3.3V
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