參數(shù)資料
型號(hào): HSMF-C153
廠商: Avago Technologies Ltd.
英文描述: Bicolor Surface Mount Chip LEDs
中文描述: 雙色表面貼裝發(fā)光二極管芯片
文件頁(yè)數(shù): 2/4頁(yè)
文件大?。?/td> 58K
代理商: HSMF-C153
2
Example of Failure Rate Calculation
Assume a device operating 8 hours/day, 5 days/week. The utilization factor, given 168 hours/week is:
(8 hours/day) x (5 days/week) / (168 hours/week) = 0.25
The point failure rate per year (8760 hours) at 25°C ambient temperature is:
(0.22% / 1K hours) x (0.25) x (8760 hours/year) = 0.482 % per year
Similarly, 90% confidence level failure rate per year at 25°C:
(0.55% / 1K hours) x (0.25) x (8760 hours/year) = 1.20% per year
Point Typical
Performance in Time
[1]
(60% Confidence)
Performance
in Time
[2]
(90% Confidence)
Ambient
Temperature (°C)
Junction
Temperature (°C)
Failure Rate
(%/1K Hours)
Failure Rate
(%/1K Hours)
MTBF
[1]
MTBF
[2]
85
75
65
55
45
35
25
90
85
81
76
66
56
46
67,500
81,000
97,800
118,600
180,800
282,900
455,300
1.48
1.23
1.02
0.84
0.55
0.35
0.22
26,900
32,200
38,900
47,200
72,000
112,600
181,200
3.72
3.11
2.57
2.12
1.39
0.89
0.55
Table 2. Reliability Predictions (I
F
= 25 mA DC)
Demonstrated Performance
Failure Rate Prediction
The failure rate of semiconductor devices is determined
by the junction temperature of the device. The
relationship between ambient temperature and actual
junction temperature is given by the following:
T
J
(°C) = T
A
(°C) +
θ
JA
P
AVG
where
T
A
= ambient temperature in °C
θ
JA
= thermal resistance of junction-to-ambient in °C/
watt
P
AVG
= average power dissipated in watts
The estimated MTBF and failure rate at temperatures
lower than the actual stress temperature can be
determined by using an Arrhenius model for
temperature acceleration. Results of such calculations
are shown in the table on the following page using an
activation energy of 0.43 eV (reference MIL-HDBK-217).
Notes:
[1] The point typical MTBF (which represents 60% confidence level) is the total device hours divided by the number of failures. In the case of
zero failures, one failure is assumed for this calculation.
[2] The 90% Confidence MTBF represents the minimum level of reliability performance which is expected from 90% of all samples. This
confidence interval is based on the statistics of the distribution of failures. The assumed distribution of failures is exponential. This
particular distribution is commonly used in describing useful life failures. Refer to MIL-STD-690B for details on this methodology.
[3] A failure is any LED which does not emit light and maximum percent I
V
degradation is >50%.
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