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參數(shù)資料
| 型號： | HS-0507RH |
| 廠商： | Intersil Corporation |
| 英文描述： | Radiation Hardened Single 16/Differential 8 Channel CMOS Analog Multiplexer |
| 中文描述： | 輻射加固單16/Differential 8通道CMOS模擬多路復(fù)用器 |
| 文件頁數(shù)： | 7/14頁 |
| 文件大?。?/td> | 1105K |
| 代理商： | HS-0507RH |
7
Specifications HS-0506RH, HS-0507RH
TABLE 5. BURN-IN DELTA PARAMETERS (T
A
= +25
o
C)
Device tested Per Table 1.
PARAMETERS
SYMBOL
DELTA LIMITS
Input Leakage Current
IIH, IIL
±
100nA
Leakage Current into the Source Terminal of an ‘‘OFF’’ Switch
+IS(OFF)
±
10nA
-IS(OFF)
±
10nA
Leakage Current into the Drain Terminal of an ‘‘OFF’’ Switch
+ID(OFF)
±
10nA
-ID(OFF)
±
10nA
Leakage Current from an ‘‘ON’’ Driver into the Switch (Drain)
+ID(ON)
±
10nA
-ID(ON)
±
10nA
Switch On Resistance
R(DS)
±
50
R(DS)
±
50
Positive Supply Current
I(+)
±
300
μ
A
Negative Supply Current
I(-)
±
100
μ
A
Positive Standby Supply Current
+ISBY
±
300
μ
A
Negative Standby Supply Current
-ISBY
±
100
μ
A
TABLE 6. APPLICABLE SUBGROUPS
GROUP A SUBGROUPS
CONFORMANCE GROUPS
MIL-STD-883 METHOD
TESTED FOR -Q
RECORDED FOR -Q
Initial Test
100% 5004
1, 9
1 (Note 2)
Interim Test
100% 5004
1, 9,
1,
(Note 2)
PDA
100% 5004
1,
Final Test
100% 5004
2, 3, 10, 11
-
Group A (Note 1)
Sample 5005
1, 2, 3, 9, 10, 11
-
Subgroup B5
Sample 5005
1, 2, 3,
1, 2, 3,
(Note 2)
Subgroup B6
Sample 5005
1
-
Group D
Sample 5005
1
-
Group E, Subgroup 2
Sample 5005
1
-
NOTES:
1. Alternate Group A testing in accordance with MIL-STD-883 Method 5005 may be exercised.
2. Table 5 parameters only.
Spec Number
518860
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