參數(shù)資料
型號: HN29W6484AH03TE
廠商: Hitachi,Ltd.
英文描述: Controller for AND Flash Memory(AND型閃速存儲器控制器)
中文描述: 控制器及快閃記憶體(及型閃速存儲器控制器)
文件頁數(shù): 53/73頁
文件大?。?/td> 435K
代理商: HN29W6484AH03TE
HN29W6484AH03TE-1
53
DC Characteristics-2
(Ta = 0 to +70°C, V
CC
= 5 V ± 10%)
Parameter
Symbol
Min
Typ
Max
Unit
Test conditions
Input voltage (CMOS level)
V
IHC
V
ILC
V
IHC
V
ILC
0.7
×
V
CC
–0.3
V
CC
+ 0.3 V
0.3
×
V
CC
V
V
CC
+ 0.3 V
0.6
Input voltage (TTL level)
2.4
–0.3
V
Schmitt circuit (CMOS level)*
1
V
TC+
V
TC
V
TC
*
V
OH
(2.8)
4.0
V
V
CC
= 5 V
1.1
(2.4)
V
2
(0.3)
V
Output voltage (CMOS)
(2 mA)*
3
V
CC
– 0.4 —
V
I
OH
= –4 mA
V
OL
V
OH
0.4
V
I
OL
= 4 mA
I
OH
= –8 mA
Output voltage (CMOS)
(3 mA)*
3
V
CC
– 0.4 —
V
V
OL
V
OH
0.4
V
I
OL
= 8 mA
I
OH
= –6 mA
Output voltage (CMOS)
(2 mA/3 mA)*
3
V
CC
– 0.4 —
V
V
OL
V
OH
0.4
V
I
OL
= 8 mA
I
OH
= –3 mA
Output voltage (CMOS)
(1 mA/2 mA)*
3
V
CC
– 0.4 —
V
V
OL
I
LI
I
LO
–I
PU
–I
PU
I
SP1
0.4
V
I
OL
= 4 mA
Input leakage current*
4
1
μA
Output leakage current*
4
220/(23) 570/(7.9) μA/(k
) V
IN
= GND
45/(110) 90/(50)
1
μA
V
OUT
= high impedance
Pull-up current/(Resistivity)
60/(92)
Pull-up current/(Resistivity)*
5
10/(550)
μA/(k
) V
IN
= GND
mA
CMOS level (control
signal = V
– 0.2)
(In Memory card mode
and I/O card mode)
Sleep/standby current*
8
(0.5)
(1.0)
Sector read current*
6, 8
I
CCR
(DC)
(40)
(70)
mA
CMOS level
(control signal = V
CC
0.2)
I
CCR
(Peak) —
I
CCW
(DC)
(80)
(120)
mA
Sector write current*
7, 8
(45)
(75)
mA
CMOS level
(control signal = V
CC
0.2)
I
CCW
(Peak) —
(80)
(120)
mA
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