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參數(shù)資料
| 型號： | HI1276AIL |
| 廠商： | INTERSIL CORP |
| 元件分類： | ADC |
| 英文描述： | 8-Bit, 500 MSPS, Flash A/D Converter |
| 中文描述： | 2-CH 8-BIT FLASH METHOD ADC, PARALLEL ACCESS, CQCC68 |
| 封裝： | CERAMIC, LCC-68 |
| 文件頁數(shù)： | 10/11頁 |
| 文件大?。?/td> | 102K |
| 代理商： | HI1276AIL |
4-10
FIGURE 15. POWER SUPPLY AND ANALOG INPUT BIAS CURRENT TEST CIRCUIT
Aperture jitter is defined as follows:
σ
t
,
Where
σ
(unit: LSB) is the deviation of the output codes when the
input frequency is exactly the same as the clock and is sampled at
the largest slew rate point.
FIGURE 16A.
FIGURE 16B. APERTURE JITTER TEST METHOD
FIGURE 16. SAMPLING DELAY AND APERTURE JITTER TEST CIRCUIT
Test Circuits
(Continued)
60 59 58 57 56 55 54 53 52 51 50 49 48 47 46 45 44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25
61
62
63
64
65
66
67
68
1
2
3
4
5
6
7
8
9
I
IN
-1V
A I
EEA
-5.2V
A
I
EED
-5.2V A
-2V
HI1276
V
IN
HI1276
8
CLK
LOGIC
ANALYZER
1024
SAMPLES
ECL
BUFFER
AMP
OSC1
φ
: VARIABLE
OSC2
100MHz
100MHz
f
R
APERTURE JITTER
σ
(LSB)
129
128
127
126
125
0V
-1V
-2V
V
IN
CLK
V
IN
CLK
υ
t
t
t
AJ
-------
σ
---------
2
π
f
×
=
=
HI1276
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