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參數(shù)資料
| 型號(hào)： | HI-8040 |
| 廠商： | Holt Integrated Circuits |
| 英文描述： | XCR3128XL-6VQ100C |
| 中文描述： | CMOS高壓顯示驅(qū)動(dòng)程序 |
| 文件頁數(shù)： | 2/6頁 |
| 文件大?。?/td> | 701K |
| 代理商： | HI-8040 |
HI-8040
FUNCTIONAL DESCRIPTION
INPUTLOGIC
BPOSCandBPIN
VEE& NEGATIVEVOLTAGECONVERTER
must be held low to enter data into the shift register.
The data is clocked on the negative edge of
mally held low and only pulsed high when new data is ready
fordisplay. WhenLDishighthelatchistransparent. Allfour
logic inputs are TTL compatible. A logic "1" at DIN that is
eventuallylatchedtothesegmentdriverswillcausetheseg-
ment to be at the opposite voltage level of the BP pin (out of
phase).
. LD is nor-
CL
The user can either make an oscillator to create the
backplane frequency or drive a signal into BPIN leaving
BPOSC open.
To make an oscillator, pins BPOSC and
BPIN must be connected together and the appropriate R
andCcombinationapplied(SeeFigure1). Iftheoscillatoris
used,thebackplanefrequencyisapproximately
1
256 RC
f =
.
(forR=180K
C=220pF, f
100Hz).
VEE may be externally driven to a maximum -30V. Alterna-
tively,thereisavoltageconverterthatwillprovide-21.4volts
(See Figure 2). If the converter pins are left open circuit, an
on-chip sense resistor will cause shut down of all current
consumption associated with the converter. The converter
will survive a shorted segment condition and continue to
maintainVEEat-20volts.
CS
BP
&
≈
DOUT
AUTOMATICSEGMENTSOFF
TESTINPUTS
The DOUT pin is available from segment 85 for cascading
devices to drive more segments and for verifying the data
integrity. Thisoutput can drive 2 TTL loads. It changes on the
positiveedgeof
.
CL
The internal backplane signal is tested continuously to be at
least 10Hz. If the detector senses f<10Hz, then the segments
are forced to the same voltage as the backplane (all segments
in "OFF" state). However, the detector is only functional while
VDDisabovetheminimumoperatingvoltagespecification.
Thetestfunctionsavailableare:
T2
0
0
1
1
0
1
0
1
Normal
AllOff
AllOn
AlternatingOn/OffSegments
The test inputs must be tied to the appropriate logic level for
correctcircuitoperation.
T1
Display
Control
OSC
V
DD
R 330K
IN5818, IN5819
330μh
V
SS
10μF
V
DD
V
SS
R
SENSE
HOLT INTEGRATED CIRCUITS
3-16
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