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參數(shù)資料
| 型號： | HI-200883 |
| 廠商： | Intersil Corporation |
| 英文描述： | Dual SPST CMOS Analog Switch |
| 中文描述： | 雙路SPST CMOS模擬開關(guān) |
| 文件頁數(shù)： | 3/11頁 |
| 文件大?。?/td> | 333K |
| 代理商： | HI-200883 |
3
FN6059.2
January 30, 2006
Supply Current
-I
CC
All Channels V
A
= 0V
1
25
-2.0
-
μA
2, 3
-55 to 125
-2.0
-
μA
All Channels V
A
= 3V
1
25
-2.0
-
μA
2, 3
-55 to 125
-2.0
-
μA
TABLE 1. D.C. ELECTRICAL PERFORMANCE SPECIFICATIONS (Continued)
Device Tested at:
+
V
SUPPLY
=
+
15V,
V
SUPPLY
=
15V, V
REF
= OPEN, GND = 0V, Unless Otherwise Specified.
D.C. PARAMETERS
SYMBOL
CONDITIONS
GROUP A
SUBGROUPS
TEMPERATURE
(°C)
MIN
MAX
UNITS
TABLE 2. A.C. ELECTRICAL PERFORMANCE SPECIFICATIONS
Device Tested at:
+
V
SUPPLY
=
+
15V,
V
SUPPLY
=
15V, V
REF
= OPEN, GND = 0V, Unless Otherwise Specified.
PARAMETERS
SYMBOL
CONDITIONS
GROUP A
SUB-
GROUPS
TEMPERATURE
(°C)
MIN
MAX
UNITS
Turn “ON” Time
t
ON
C
L
= 35pF,
R
L
= 1k
9
25
-
500
ns
10, 11
55 to 125
-
800
ns
Turn “OFF” Time
t
OFF
C
L
= 33pF,
R
L
= 1k
9
25
-
500
ns
10, 11
55 to 125
-
650
ns
TABLE 3. ELECTRICAL PERFORMANCE SPECIFICATIONS (NOTE 1)
Device Tested at:
+
V
SUPPLY
=
+
15V,
V
SUPPLY
=
15V, V
REF
= OPEN, GND = 0V
PARAMETERS
SYMBOL
CONDITIONS
NOTE
TEMPERATURE
(°C)
MIN
MAX
UNITS
Address Capacitance
C
A
f = 1MHz, V
AL
= 0V
f = 1MHz, V
AH
= 5V,
Measured Source to GND
1
25
-
20
pF
Switches Input
Capacitance
C
S (OFF)
1
25
-
20
pF
Switch Output Capacitance
C
D (OFF)
f = 1MHz, V
AH
= 5V,
Measured Output to Ground
1
25
-
20
pF
C
D (ON)
f = 1MHz, V
AL
= 0V,
Measured Output to Ground
1
25
-
30
pF
Drain to Source
Capacitance
C
DS
f = 1MHz, V
AH
= 5V
1
25
-
2.0
pF
Off Isolation
V
ISO
f = 200kHz, V
A
= 2.4, R
L
= 1K,
V
GEN
= 1V
P-P,
C
L
= 10pF
f = 200kHz, V
A
= 2.4, R
L
= 1K,
V
GEN
= 1V
P-P,
C
L
= 10pF
f = 200kHz, V
A
= 0 to 4V,
C
L
= 0.01μF
1
25
55
-
dB
Cross Talk
V
CT
1
25
60
-
dB
Charge Transfer Error
V
CTE
1
25
-10
10
mV
NOTE:
1. Parameters listed in Table 2 are controlled via design or process parameters and are not directly tested at final production. These parameters
are lab characterized upon initial design release, or upon design changes. These parameters are guaranteed by characterization based upon
data from multiple production runs which reflect lot to lot and within lot variation.
TABLE 4. ELECTRICAL TEST REQUIREMENTS
MIL-STD-883 TEST REQUIREMENTS
SUBGROUPS
(Tables 1 and 2)
Interim Electrical Parameters (Pre Burn-in)
1
Final Electrical Test Parameters
1 (Note 2), 2, 3, 9, 10, 11
Group A Test Requirements
1, 2, 3, 9, 10, 11
Groups C & D Endpoints
1
NOTE:
2. PDA applies to Subgroup 1 only.
HI-200/883
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