參數(shù)資料
型號: HEF4094BT
廠商: NXP Semiconductors N.V.
元件分類: 通用總線功能
英文描述: 8-stage shift-an-store register
封裝: HEC4094BT<SOT109-1 (SO16)|<<http://www.nxp.com/packages/SOT109-1.html<1<week 6, 2004,;HEF4094BP<SOT38-4 (DIP16)|<<http://www.nxp.com/packages/SOT38-4.html<1<Always
文件頁數(shù): 11/19頁
文件大?。?/td> 160K
代理商: HEF4094BT
HEF4094B_8
All information provided in this document is subject to legal disclaimers.
NXP B.V. 2010. All rights reserved.
Product data sheet
Rev. 08 — 2 April 2010
11 of 19
NXP Semiconductors
HEF4094B
8-stage shift-and-store register
a. Input waveform
b. Test circuit
Test data is given in
Table 10
.
Definitions for test circuit:
DUT = Device Under Test.
C
L
= load capacitance including jig and probe capacitance.
R
L
= load resistance.
R
T
= termination resistance should be equal to the output impedance Z
o
of the pulse generator.
Fig 10. Test circuit
V
M
V
M
t
W
t
W
10 %
90 %
0 V
V
I
V
I
negative
pulse
positive
pulse
0 V
V
M
V
M
90 %
10 %
t
f
t
r
t
r
t
f
001aaj781
001aaj915
V
EXT
V
DD
V
I
V
O
DUT
CL
RT
RL
G
Table 10.
Supply voltage
V
DD
5 V to 15 V
Test data
Input
V
I
V
SS
or V
DD
V
EXT
t
PHL
, t
PLH
open
Load
C
L
50 pF
t
r
, t
f
20 ns
t
PHZ
, t
PZH
V
SS
t
PLZ
, t
PZL
V
DD
R
L
1 k
Ω
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