參數(shù)資料
型號: HCTS365KMSR
廠商: INTERSIL CORP
元件分類: 通用總線功能
英文描述: Radiation Hardened Hex Buffer/Line Driver Non-Inverting
中文描述: HCT SERIES, 6-BIT DRIVER, TRUE OUTPUT, CDFP16
封裝: CERAMIC, DFP-16
文件頁數(shù): 6/10頁
文件大?。?/td> 200K
代理商: HCTS365KMSR
6
Specifications HCTS365MS
TABLE 7. TOTAL DOSE IRRADIATION
CONFORMANCE
GROUPS
METHOD
TEST
READ AND RECORD
PRE RAD
POST RAD
PRE RAD
POST RAD
Group E Subgroup 2
5005
1, 7, 9
Table 4
1, 9
Table 4 (Note 1)
NOTE:
1. Except FN test which will be performed 100% Go/No-Go.
TABLE 8. STATIC BURN-IN AND DYNAMIC BURN-IN TEST CONNECTIONS
OPEN
GROUND
1/2 VCC = 3V
±
0.5V
VCC = 6V
±
0.5V
OSCILLATOR
50kHz
25kHz
STATIC BURN-IN I TEST CONNECTIONS (Note 1)
3, 5, 7, 9, 11,
13
1, 2, 4, 6, 8, 10, 12, 14,
15
-
16
-
-
STATIC BURN-IN II TEST CONNECTIONS (Note 1)
3, 5, 7, 9, 11,
13
8
-
1, 2, 4, 6, 10, 12, 14, 15,
16
-
-
DYNAMIC BURN-IN TEST CONNECTIONS (Note 2)
-
1, 8, 15
3, 5, 7, 9, 11, 13
16
2, 4, 6, 10, 12, 14
-
NOTES:
1. Each pin except VCC and GND will have a resistor of 10K
±
5% for static burn-in.
2. Each pin except VCC and GND will have a resistor of 680
±
5% for dynamic burn-in.
TABLE 9. IRRADIATION TEST CONNECTIONS
OPEN
GROUND
VCC = 5V
±
0.5V
3, 5, 7, 9, 11, 13
8
1, 2, 4, 6, 10, 12, 14 - 16
NOTE: Each pin except VCC and GND will have a resistor of 47K
±
5% for irradiation testing.
Group E, Subgroup 2, sample size is 4 dice/wafer 0 failures.
Spec Number
518637
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