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參數(shù)資料
| 型號： | HCTS11MS |
| 廠商： | INTERSIL CORP |
| 元件分類： | 通用總線功能 |
| 英文描述： | Quadruple 2-Input Positive-NAND Gate 20-LCCC -55 to 125 |
| 中文描述： | HCT SERIES, TRIPLE 3-INPUT AND GATE, UUC14 |
| 封裝： | 2.20 X 2.24 MM, DIE-14 |
| 文件頁數(shù)： | 5/7頁 |
| 文件大?。?/td> | 121K |
| 代理商： | HCTS11MS |
7-145
Specifications HCTS11MS
OPEN
GROUND
1/2 VCC = 3V
±
0.5V
VCC = 6V
±
0.5V
OSCILLATOR
50kHz
25kHz
STATIC BURN-IN I TEST CONDITIONS (Note 1)
6, 8, 12
1, 2, 3, 4, 5, 7, 9, 10, 11,
13
-
14
-
-
STATIC BURN-IN II TEST CONDITIONS (Note 1)
6, 8, 12
7
-
1, 2, 3, 4, 5, 9, 10,
11, 13, 14
-
-
DYNAMIC BURN-IN TEST CONDITIONS (Note 2)
-
7
6, 8, 12
14
1, 2, 3, 4, 5, 9, 10,
11, 13
-
NOTE:
1.
2. Each pin except VCC and GND will have a resistor of 1K
±
5% for dynamic burn-in
Each pin except VCC and GND will have a resistor of 10K
±
5% for static burn-in
TABLE 9. IRRADIATION TEST CONNECTIONS
OPEN
GROUND
VCC = 5V
±
0.5V
6, 8, 12
7
1, 2, 3, 4, 5, 9, 10, 11, 13, 14
NOTE: Each pin except VCC and GND will have a resistor of 47K
±
5% for irradiation testing.
Group E, Subgroup 2, sample size is 4 dice/wafer 0 failures.
AC Timing Diagrams
AC VOLTAGE LEVELS
PARAMETER
HCTS
UNITS
VCC
4.50
V
VIH
3.00
V
VS
1.30
V
VIL
0
V
GND
0
V
VS
INPUT
OUTPUT
OUTPUT
TTHL
80%
20%
80%
20%
VIH
VIL
VOH
VOL
VOH
VOL
TPLH
TPHL
VS
TTLH
AC Load Circuit
DUT
TEST
POINT
CL
RL
CL = 50pF
RL = 500
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