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參數(shù)資料
| 型號(hào)： | HCS241MS |
| 廠商： | Intersil Corporation |
| 英文描述： | Radiation Hardened Inverting Octal Three-State Buffer/Line Driver(抗輻射八三態(tài)緩沖器/線驅(qū)動(dòng)器) |
| 中文描述： | 輻射加固反相八路三態(tài)緩沖器/線路驅(qū)動(dòng)器（抗輻射八三態(tài)緩沖器/線驅(qū)動(dòng)器） |
| 文件頁數(shù)： | 6/9頁 |
| 文件大?。?/td> | 169K |
| 代理商： | HCS241MS |
307
Specifications HCS241MS
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUPS
METHOD
GROUP A SUBGROUPS
READ AND RECORD
Initial Test (Preburn-In)
100%/5004
1, 7, 9
ICC, IOL/H, IOZL/H
Interim Test
I
(Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H, IOZL/H
Interim Test
II
(Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H, IOZL/H
PDA
100%/5004
1, 7, 9, Deltas
Interim Test
III
(Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H, IOZL/H
PDA
100%/5004
1, 7, 9, Deltas
Final Test
100%/5004
2, 3, 8A, 8B, 10, 11
Group A (Note 1)
Sample/5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
Group B
Subgroup B-5
Sample/5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
Subgroups 1, 2, 3, 9, 10, 11
Subgroup B-6
Sample/5005
1, 7, 9
Group D
Sample/5005
1, 7, 9
NOTE:
1. Alternate Group A testing in accordance with Method 5005 of MIL-STD-883 may be exercised.
TABLE 7. TOTAL DOSE IRRADIATION
CONFORMANCE
GROUPS
METHOD
TEST
READ AND RECORD
PRE RAD
POST RAD
PRE RAD
POST RAD
Group E Subgroup 2
5005
1, 7, 9
Table 4
1, 9
Table 4 (Note 1)
NOTE:
1. Except FN test which will be performed 100% Go/No-Go.
TABLE 8. STATIC AND DYNAMIC BURN-IN TEST CONNECTIONS
OPEN
GROUND
1/2 VCC = 3V
±
0.5V
VCC = 6V
±
0.5V
OSCILLATOR
50kHz
25kHz
STATIC BURN-IN I TEST CONDITIONS (Note 1)
3, 5, 7, 9, 12, 14, 16,
18
1, 2, 4, 6, 8, 10, 11, 13,
15, 17, 19
-
20
-
-
STATIC BURN-IN II TEST CONNECTIONS (Note 1)
3, 5, 7, 9, 12, 14, 16,
18
10
-
1, 2, 4, 6, 8, 11, 13,
15, 17, 19, 20
-
-
DYNAMIC BURN-IN TEST CONNECTIONS (Note 1)
-
1, 10
3, 5, 7, 9, 12, 14, 16,
18
19, 20
2, 4, 6, 8, 11, 13,
15, 17
-
NOTES:
1. Each pin except VCC and GND will have a series resistor of 10K
±
5%.
2. Each pin except VCC and GND will have a series resistor of 680
±
5%
TABLE 9. IRRADIATION TEST CONNECTIONS
OPEN
GROUND
VCC = 5V
±
0.5V
3, 5, 7, 9, 12, 14, 16, 18
10
1, 2, 4, 6, 8, 11, 13, 15, 17, 19, 20
NOTE: Each pin except VCC and GND will have a series resistor of 47K
±
5%. Group E,
Subgroup 2, sample size is 4 dice/wafer, 0 failures.
Spec Number
518838
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相關(guān)代理商/技術(shù)參數(shù) |
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| HCS244D | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened Octal Buffer/Line Driver, Three-State |
| HCS244D/Sample | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened Octal Buffer/Line Driver, Three-State |
| HCS244DMSR | 制造商:Intersil Corporation 功能描述:RAD HARD OCTAL BUFFER/LINE DRIVER,3-ST,DP,200K,CMOS,CLS V - Rail/Tube |
| HCS244DTR | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened Octal Buffer/Line Driver, Three-State |
| HCS244HMSR | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened Octal Buffer/Line Driver, Three-State |
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