
inputs generated internally to allow synchronous or
asynchronous data transfer from master to slave.
Isolationfrom external noise andtheeffects ofload-
ing is provided by output buffering.
PARALLELOPERATION
– A high P/S input signal
allows data transfer into the register via the parallel
data lines synchronously with the positive transition
of the clock provided the A/S input is low. If the A/S
input ishigh the transfer isindependent of theclock.
The direction of data flow is controlled by the A/B
input. When this signal is high the A data lines are
inputs (and B data lines are outputs) ; a low A/Bsig-
nal reverses thedirection of dataflow.The AE-input
is an additional feature which allows manyregisters
tofeeddatatoacommonbus. TheADATAlinesare
enabledonly when this signal is high. Datastorage
through recirculation of data in each register stage
is accomplished by making the A/B signal high and
the AE signal low.
SERIALOPERATION
–AlowP/Ssignal allows ser-
ial data to transfer into the register synchronously
withthepositivetransitionoftheclock.The A/Sinput
isinternally disabled whentheregister isinthe serial
mode (asynchronous
serial
allowed). The serial data appears as output dataon
either the B lines (when A/B is high) or the A lines
(whenA/B islow andtheAEsignal ishigh). Register
expansion can be accomplished by simply cascad-
ing
HCC/HCF4034B
packages.
operation
is not
FUNCTIONAL DIAGRAM
ABSOLUTE MAXIMUM RATINGS
Symbol
V
DD
*
Parameter
Value
Unit
V
V
V
mA
mW
Supply Voltage :
HCC
Types
HCF
Types
– 0.5 to + 20
– 0.5 to + 18
– 0.5 to V
DD
+ 0.5
±
10
200
V
i
I
I
Input Voltage
DC Input Current (any one input)
Total Power Dissipation (per package)
Dissipation per Output Transistor
for T
op
= Full Package-temperature Range
Operating Temperature :
HCC
Types
P
tot
100
mW
°
C
°
C
°
C
T
op
HCF
Types
– 55 to + 125
– 40 to + 85
– 65 to + 150
T
stg
Storage Temperature
Stresses above those listed under ”Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress
rating only and functional operation of the device at these or any other conditions above those indicated in the operational sec-
tions of this specification is not implied. Exposure to absolute maximum rating conditions for external periods may affect device
reliability.
HCC/HCF4034B
2/16