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| 型號： | HC5518X |
| 廠商： | Intersil Corporation |
| 英文描述： | () |
| 中文描述： | （） |
| 文件頁數(shù)： | 5/5頁 |
| 文件大?。?/td> | 37K |
| 代理商： | HC5518X |
5
All Intersil semiconductor products are manufactured, assembled and tested under
ISO9000
quality systems certification.
Intersil semiconductor products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time with-
out notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and
reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result
from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see web site
http://www.intersil.com
AC POWER CROSS TEST PROCEDURE
TEST PROCEDURE FOR TEST NO. 1, 2, 3, 4, 5, 6
TEST PROCEDURE FOR TEST NO. 7, 8, 9, 10, 11, 12
1.
With PTC in circuit.
1.
With PTC in circuit.
2.
Collect pre-test data on open tip and ring voltage and loop current
readings with 600
load for V
BH
and V
BL
mode and record the data.
2.
Collect pre-test data.
3.
Store the V
P
waveforms on scope screen when first applying the test
signal and record the data.
3.
Store the V
P
waveforms on scope screen when first applying the test
signal and record the data.
4.
Set storage scope to real time mode.
4.
Set storage scope to real time mode.
5.
Record the PTC time to trip data if PTC tripped.
5.
Record the thermal alarm data if SLIC went into thermal alarm within
1 minute.
6.
Record the thermal alarm data if SLIC went into thermal alarm.
6.
Replace the PTC with a 5
power resistor and set the timer to 1 sec-
ond on, 2 seconds off.
7.
Collect the post-test data on open tip and ring voltage and loop cur-
rent readings with 600
load for V
BH
and V
BL
mode and record the
data.
7.
Collect the post-test data.
8.
The DUT passes the test, if the difference between the pre and post-
test data are less than 5%. Otherwise, the DUT fails the test.
8.
The DUT passes the test, if the difference between the pre and post-
test data are less than 5%. Otherwise, the DUT fails the test.
R
P1
V
CC
VBL
V
BL
VBH
R
P2
D
1
D
2
D
4
D
3
RING
TIP
R
PT
R
PR
PTC
PTC
(TR600-150)
SG1
D
5
V
BH
BGND
AGND
VCC
5
5
10
10
20
20
C
G
0.1
μ
F
200V
RSLIC18
SGT27S10
(TR600-150)
V
P
V
P
REN
LOAD
D
6
VRS
FIGURE 3. RINGING CAPABILITY TEST CIRCUIT
TABLE 4. RINGING CAPABILITY AT 1% THD
V
BH
1 REN
3 REN
5 REN
-90V
87.5Vp
83.5Vp
80.5Vp
-85V
83.4Vp
82.0Vp
80.5Vp
-80V
77.0Vp
74.5Vp
71.0Vp
1 REN = 6k
+ 8
μ
F
3 REN = 2k
+ 24
μ
F
5 REN = 1.2k
+ 40
μ
F
Application Note 9842
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| HCPL-0730 | LOW INPUT CURRENT HIGH GAIN SPLIT DARLINGTON OPTOCOUPLERS |
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相關代理商/技術參數(shù) |
參數(shù)描述 |
|---|---|
| HC5518XEVAL1 | 制造商:Intersil Corporation 功能描述:EVALUATION BOARD FOR RS - Bulk 制造商:Rochester Electronics LLC 功能描述:EVALUATION BOARD FOR RS - Bulk |
| HC5519 | 制造商:HARRIS 制造商全稱:HARRIS 功能描述:SLIC Subscriber Line Interface Circuit |
| HC5519 WAF | 制造商:Harris Corporation 功能描述: |
| HC5519CQ | 制造商:HARRIS 制造商全稱:HARRIS 功能描述:SLIC Subscriber Line Interface Circuit |
| HC5520 | 制造商:HARRIS 制造商全稱:HARRIS 功能描述:CO/PABX Polarity Reversal Subscriber Line Interface Circuit |
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