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| 型號(hào)： | GS8644Z36E-166V |
| 廠商： | GSI TECHNOLOGY |
| 元件分類： | DRAM |
| 英文描述： | 72Mb Pipelined and Flow Through Synchronous NBT SRAM |
| 中文描述： | 2M X 36 ZBT SRAM, 7 ns, PBGA165 |
| 封裝： | 15 X 17 MM, 1 MM PITCH, FPBGA-165 |
| 文件頁(yè)數(shù)： | 4/30頁(yè) |
| 文件大小： | 744K |
| 代理商： | GS8644Z36E-166V |
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Preliminary
GS8644Z18/36E-xxxV
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
Rev: 1.05 6/2006
4/30
2003, GSI Technology
GS8644Z18/36E-xxxV 165-Bump BGA Pin Description
Symbol
Type
Description
A
0
, A
1
I
Address field LSBs and Address Counter Preset Inputs
A
I
Address Inputs
DQ
A
DQ
B
DQ
C
DQ
D
I/O
Data Input and Output pins
B
A
, B
B
, B
C
, B
D
I
Byte Write Enable for DQ
A
, DQ
B
, DQ
C
, DQ
D
I/Os; active low
NC
—
No Connect
CK
I
Clock Input Signal; active high
CKE
I
Clock Enable; active low
W
I
Write Enable; active low
E
1
I
Chip Enable; active low
E
3
I
Chip Enable; active low
E
2
I
Chip Enable; active high
FT
I
Flow Through / Pipeline Mode Control
G
I
Output Enable; active low
ADV
I
Burst address counter advance enable; active high
ZQ
I
FLXDrive Output Impedance Control
Low = Low Impedance [High Drive], High = High Impedance [Low Drive])
ZZ
I
Sleep mode control; active high
LBO
I
Linear Burst Order mode; active low
TMS
I
Scan Test Mode Select
TDI
I
Scan Test Data In
TDO
O
Scan Test Data Out
TCK
I
Scan Test Clock
MCH
—
Must Connect High
V
DD
I
Core power supply
V
SS
I
I/O and Core Ground
V
DDQ
I
Output driver power supply
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| GS8644Z36E-225 | 制造商:GSI 制造商全稱:GSI Technology 功能描述:72Mb Pipelined and Flow Through Synchronous NBT SRAM |
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