參數(shù)資料
型號: GS832236E-166
廠商: Electronic Theatre Controls, Inc.
英文描述: DIODE ZENER SINGLE 500mW 3.9Vz 20mA-Izt 0.05 10uA-Ir 1Vr DO35-GLASS 5K/AMMO
中文描述: 200萬× 18,100萬× 36,為512k × 72分配36MB的S /雙氰胺同步突發(fā)靜態(tài)存儲器
文件頁數(shù): 10/41頁
文件大?。?/td> 1223K
代理商: GS832236E-166
Preliminary
GS832218(B/E)/GS832236(B/E)/GS832272(C)
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
Rev: 1.06 9/2004
10/41
2001, GSI Technology
GS832218/36 119-Bump BGA Pin Description
Symbol
A
0
, A
1
An
DQ
A
DQ
B
DQ
C
DQ
D
B
A
, B
B
, B
C
, B
D
NC
CK
BW
GW
E
1
G
ADV
ADSP, ADSC
ZZ
FT
LBO
Type
I
I
Description
Address field LSBs and Address Counter Preset Inputs
Address Inputs
I/O
Data Input and Output pins
I
Byte Write Enable for DQ
A
, DQ
B
, DQ
C
, DQ
D
I/Os; active low
No Connect
Clock Input Signal; active high
Byte Write—Writes all enabled bytes; active low
Global Write Enable—Writes all bytes; active low
Chip Enable; active low
Output Enable; active low
Burst address counter advance enable; active low
Address Strobe (Processor, Cache Controller); active low
Sleep mode control; active high
Flow Through or Pipeline mode; active low
Linear Burst Order mode; active low
FLXDrive Output Impedance Control (Low = Low Impedance [High Drive], High = High Impedance [Low
Drive])
Single Cycle Deselect/Dual Cyle Deselect Mode Control
I
I
I
I
I
I
I
I
I
I
ZQ
I
SCD
I
TMS
I
Scan Test Mode Select
TDI
I
Scan Test Data In
TDO
O
Scan Test Data Out
TCK
V
DD
V
SS
V
SS
V
DDQ
I
Scan Test Clock
I
Core power supply
I
I/O and Core Ground
I
I/O and Core Ground
I
Output driver power supply
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