• 參數(shù)資料
    型號: GS816272CGC-250V
    廠商: GSI TECHNOLOGY
    元件分類: DRAM
    英文描述: 256K x 72 18Mb S/DCD Sync Burst SRAMs
    中文描述: 256K X 72 CACHE SRAM, 5.5 ns, PBGA209
    封裝: 14 X 22 MM, 1 MM PITCH, ROHS COMPLIANT, BGA-209
    文件頁數(shù): 20/29頁
    文件大?。?/td> 851K
    代理商: GS816272CGC-250V
    GS816272CC-xxxV
    Preliminary
    Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
    Rev: 1.02a 6/2006
    20/29
    2004, GSI Technology
    JTAG Port Operation
    Overview
    The JTAG Port on this RAM operates in a manner that is compliant with IEEE Standard 1149.1-1990, a serial boundary scan
    interface standard (commonly referred to as JTAG). The JTAG Port input interface levels scale with V
    DD
    . The JTAG output
    drivers are powered by V
    DDQ
    .
    Disabling the JTAG Port
    It is possible to use this device without utilizing the JTAG port. The port is reset at power-up and will remain inactive unless
    clocked. TCK, TDI, and TMS are designed with internal pull-up circuits.To assure normal operation of the RAM with the JTAG
    Port unused, TCK, TDI, and TMS may be left floating or tied to either V
    DD
    or V
    SS
    . TDO should be left unconnected.
    JTAG Pin Descriptions
    Pin
    Pin Name
    I/O
    Description
    TCK
    Test Clock
    In
    Clocks all TAP events. All inputs are captured on the rising edge of TCK and all outputs propagate
    from the falling edge of TCK.
    The TMS input is sampled on the rising edge of TCK. This is the command input for the TAP
    controller state machine. An undriven TMS input will produce the same result as a logic one input
    level.
    The TDI input is sampled on the rising edge of TCK. This is the input side of the serial registers
    placed between TDI and TDO. The register placed between TDI and TDO is determined by the
    state of the TAP Controller state machine and the instruction that is currently loaded in the TAP
    Instruction Register (refer to the TAP Controller State Diagram). An undriven TDI pin will produce
    the same result as a logic one input level.
    Output that is active depending on the state of the TAP state machine. Output changes in
    response to the falling edge of TCK. This is the output side of the serial registers placed between
    TDI and TDO.
    TMS
    Test Mode Select
    In
    TDI
    Test Data In
    In
    TDO
    Test Data Out
    Out
    Note:
    This device does not have a TRST (TAP Reset) pin. TRST is optional in IEEE 1149.1. The Test-Logic-Reset state is entered while TMS is
    held high for five rising edges of TCK. The TAP Controller is also reset automaticly at power-up.
    JTAG Port Registers
    Overview
    The various JTAG registers, refered to as Test Access Port orTAP Registers, are selected (one at a time) via the sequences of 1s
    and 0s applied to TMS as TCK is strobed. Each of the TAP Registers is a serial shift register that captures serial input data on the
    rising edge of TCK and pushes serial data out on the next falling edge of TCK. When a register is selected, it is placed between the
    TDI and TDO pins.
    Instruction Register
    The Instruction Register holds the instructions that are executed by the TAP controller when it is moved into the Run, Test/Idle, or
    the various data register states. Instructions are 3 bits long. The Instruction Register can be loaded when it is placed between the
    TDI and TDO pins. The Instruction Register is automatically preloaded with the IDCODE instruction at power-up or whenever the
    controller is placed in Test-Logic-Reset state.
    Bypass Register
    The Bypass Register is a single bit register that can be placed between TDI and TDO. It allows serial test data to be passed through
    the RAM’s JTAG Port to another device in the scan chain with as little delay as possible.
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