參數(shù)資料
型號(hào): GS816236D-150I
廠商: GSI TECHNOLOGY
元件分類(lèi): DRAM
英文描述: 1M x 18, 512K x 36, 256K x 72 18Mb Sync Burst SRAMs
中文描述: 512K X 36 CACHE SRAM, 7.5 ns, PBGA165
封裝: 13 X 15 MM, 1 MM PITCH, FBGA-165
文件頁(yè)數(shù): 18/41頁(yè)
文件大?。?/td> 980K
代理商: GS816236D-150I
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GS816218(B/D)/GS816236(B/D)/GS816272(C)
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
Rev: 2.17 11/2004
18/41
1999, GSI Technology
Capacitance
(T
A
= 25
C, f = 1 MH
Z
, V
DD
= 2.5 V)
Note:
These parameters are sample tested.
AC Test Conditions
Parameter
Symbol
C
IN
C
I/O
Test conditions
V
IN
= 0 V
V
OUT
= 0 V
Typ.
Max.
Unit
Input Capacitance
4
5
pF
Input/Output Capacitance
7
pF
Parameter
Conditions
V
DD
– 0.2 V
0.2 V
1 V/ns
V
DD
/2
V
DDQ
/2
Fig. 1
Input high level
Input low level
Input slew rate
Input reference level
Output reference level
Output load
Notes:
1.
2.
Include scope and jig capacitance.
Test conditions as specified with output loading as shown in
Fig. 1
unless otherwise noted.
Device is deselected as defined by the Truth Table.
3.
50% tKC
V
SS
2.0 V
50%
V
SS
V
IH
Undershoot Measurement and Timing
Overshoot Measurement and Timing
50% tKC
V
DD
+ 2.0 V
50%
V
DD
V
IL
DQ
V
DDQ/2
50
30pF
*
Output Load 1
* Distributed Test Jig Capacitance
相關(guān)PDF資料
PDF描述
GS816236D-166 1M x 18, 512K x 36, 256K x 72 18Mb Sync Burst SRAMs
GS816236D-166I 1M x 18, 512K x 36, 256K x 72 18Mb Sync Burst SRAMs
GS816236D-200 1M x 18, 512K x 36, 256K x 72 18Mb Sync Burst SRAMs
GS816236D-200I 1M x 18, 512K x 36, 256K x 72 18Mb Sync Burst SRAMs
GS816236D-225 1M x 18, 512K x 36, 256K x 72 18Mb Sync Burst SRAMs
相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
GS816236D-166I 制造商:GSI Technology 功能描述:512K X 36 CACHE SRAM, 7 ns, PBGA165
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