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參數(shù)資料
| 型號： | GP2Y3A003K0F |
| 廠商： | Sharp Corporation |
| 英文描述： | Optoelectronic Device |
| 中文描述： | 光電器件 |
| 文件頁數(shù)： | 4/10頁 |
| 文件大?。?/td> | 282K |
| 代理商： | GP2Y3A003K0F |
GP2Y3A003K0F
4
Data Sheet
REALIABILITY
The reliability requirements of this device are listed
in Table 1.
NOTES:
1. Test conditions are according to Electro-optical Characteristics, shown on page 2.
2. At completion of the test, allow device to remain at nominal room temperature and humidity (non-condensing) for two hours.
3. Confidence level: 90%, Lot Tolerance Percent Defect (LTPD): 20%/40%.
MANUFACTURER’S INSPECTION
Inspection Lot
Inspection shall be carried out per each delivery lot.
Inspection Method
A single sampling plan, normal inspection level II
based on ISO 2
8
59 shall be adopted.
NOTE: *
Any one of these that affects the Electro-optical Characteristics shall be considered a defect.
Table 1. Reliability
TEST ITEMS
TEST CONDITIONS
FAILURE
JUDGEMENT
CRITERIA
SAMPLES (n),
DEFECTIVE (C)
Temperature Cycling
One cycle -40°C (30 min.) to +70°C in 30
minutes, repeated 25 times
Initial × 0.
8
>
V
O
V
O
> Initial × 1.2
n = 11, C = 0
High Temperature and
High Humidity Storage
+40°C, 90% RH, 500h
n = 11, C = 0
High Temperature Storage
+70°C, 500h
n = 11, C = 0
Low Temperature Storage
-40°C, 500h
n = 11, C = 0
Operational Life
(High Temperature)
+60°C,
V
CC
= 5
V
, 500h
n = 11, C = 0
Mechanical Shock
100 m/s
2
, 6.0 ms
3 times/±X, ±Y, ±Z direction
n =
8
, C = 0
V
ariable Frequency
V
ibration
10-to-55-to-10 Hz in 1 minute
Amplitude: 1.5 mm
2h in each X, Y, Z direction
n =
8
, C = 0
Table 2. Quality Level
DEFECT
INSPECTION ITEM and TEST METHOD
AQL (%)
Major Defect
Minor Defect
Electro-optical characteristics defect
Defect to appearance or dimensions (crack, split, chip, scratch, stain)*
0.4
1.0
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