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參數(shù)資料
| 型號： | GLT4160L04-60TC |
| 廠商： | Electronic Theatre Controls, Inc. |
| 英文描述： | 4M X 4 CMOS DYNAMIC RAM WITH EXTENDED DATA OUTPUT |
| 中文描述： | 4米× 4 CMOS動態(tài)RAM的擴展數(shù)據(jù)輸出 |
| 文件頁數(shù)： | 18/22頁 |
| 文件大小： | 588K |
| 代理商： | GLT4160L04-60TC |
G-LINK
GLT4160L04
4M X 4 CMOS DYNAMIC RAM WITH EXTENDED DATA OUTPUT
May 2001 (Rev.3.1)
G-Link Technology
2701 Northwestern Parkway
Santa Clara, CA 95051, U.S.A.
G-Link Technology Corporation,Taiwan
6F, No. 24-2, Industry E. RD, IV, Science Based
Industrial Park, Hsin Chu, Taiwan.
- 18 -
TEST MODE IN CYCLE
t
RP
t
RC
t
RAS
t
RP
t
RPC
t
CP
t
CSR
t
CHR
t
WTS
t
WTH
t
CEZ
OPEN
t
RPC
Don't Care
V
IH-
V
IL-
V
IH-
V
IL-
V
IH-
V
IL-
V
I/OH-
V
I/OL-
RAS
CAS
WE
DQ
Test Mode
By using the test mode, the test time can be reduced. The reason for this is that, the memory emulates the x
16-bit organization during test mode. Don’t care about the input levels of the CAS input A0, A1 .
(1) Setting the mode
Executing the test mode cycle (WE , CAS before RAS refresh cycle ) sets the test mode.
(2) Write / read operation
When either a “0” or a “1” is written to the input pin in test mode, this data is written to 16 bits of memory
cell.
Next, when the data is read from the output pin at the same address, the cell be checked.
Output = “1” Normal write (all memory cells)
Output = “0” Abnormal write
(3) Refresh
Refresh in the test mode must be performed with the RAS / CAS cycle or with the WE, CAS before RAS
refresh cycle. The WE, CAS before RAS refresh cycle use the same counter as the CAS before RAS
refresh’s internal counter.
(4) Mode Cancellation
The test mode is cancelled by executing one cycle of RAS only refresh cycle or CAS before RAS refresh
cycle.
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| GLT4160L04-70J3 | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:4M X 4 CMOS DYNAMIC RAM WITH EXTENDED DATA OUTPUT |
| GLT4160L04-70TC | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:4M X 4 CMOS DYNAMIC RAM WITH EXTENDED DATA OUTPUT |
| GLT4160L04E-40J3 | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:4M X 4 CMOS DYNAMIC RAM WITH EXTENDED DATA OUTPUT |
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