Chapter 1: Cyclone IV Device Datasheet
1–9
Operating Conditions
December 2013
Altera Corporation
The OCT resistance may vary with the variation of temperature and voltage after
final OCT resistance considering the variations after calibration at device power-up.
Table 1–10 lists the change percentage of the OCT resistance with voltage and
temperature.
Table 1–10. OCT Variation After Calibration at Device Power
-Up for Cyclone IV Devices
Nominal Voltage
dR/dT (%/°C)
dR/dV (%/mV)
3.0
0.262
–0.026
2.5
0.234
–0.039
1.8
0.219
–0.086
1.5
0.199
–0.136
1.2
0.161
–0.288
R
V = (V2 – V1) × 1000 × dR/dV –––––
R
T = (T2 – T1) × dR/dT –––––
For
R
x < 0; MFx = 1/ (|Rx|/100 + 1) –––––
For Rx > 0; MFx = Rx/100 + 1 ––––– (10) MF = MFV × MFT ––––– (11) Rfinal = Rinitial × MF ––––– (12) (1) T2 is the final temperature.
(2) T1 is the initial temperature.
(3) MF is multiplication factor.
(4) Rfinal is final resistance.
(5) Rinitial is initial resistance.
(6) Subscript x refers to both V and T.
(7)
R
V is a variation of resistance with voltage.
(8)
R
T is a variation of resistance with temperature.
(9) dR/dT is the change percentage of resistance with temperature after calibration at device power
-up.
(10) dR/dV is the change percentage of resistance with voltage after calibration at device power
-up.
(11) V2 is final voltage.
(12) V1 is the initial voltage.
