
EL2252C
Dual 50 MHz ComparatorPin Receiver
Absolute Maximum Ratings (T
A
e
25 C)
Voltage between Va and Vb
36V
Voltage at Va
18V
Voltage between bIN and aIN pins
36V
Output Current
12 mA
Current into aIN bIN HYS
or TTL
5 mA
Internal Power Dissipation
See Curves
Operating Ambient Temperature Range
b
25 Cto a85 C
Operating Junction Temperature
150 C
Storage Temperature Range
b
65 to a150C
Important Note
All parameters having MinMax specifications are guaranteed The Test Level column indicates the specific device testing actually
performed during production and Quality inspection Elantec performs most electrical tests using modern high-speed automatic test
equipment specifically the LTX77 Series system Unless otherwise noted all tests are pulsed tests therefore TJeTCeTA
Test Level
Test Procedure
I
100% production tested and QA sample tested per QA test plan QCX0002
II
100% production tested at TA e 25 C and QA sample tested at TA e 25 C
TMAX and TMIN per QA test plan QCX0002
III
QA sample tested per QA test plan QCX0002
IV
Parameter is guaranteed (but not tested) by Design and Characterization Data
V
Parameter is typical value at TA e 25 C for information purposes only
DC Electrical Characteristics V
S
e g
15V HYS and TTL grounded TA e 25 C unless otherwise specified
Parameter
Description
Temp
Min
Typ
Max
Test Level
Units
EL2252C
VOS
Input Offset Voltage
25 C1
9
I
mV
Full
13
III
mV
TCVOS
Average Offset Voltage Drift
Full
7
V
mVC
IB
Input Bias Current at Null
25 C
6
16
I
mA
Full
21
III
mA
IOS
Input Offset Current
25 C
02
1
I
mA
Full
2
III
mA
RIN diff
Input Differential Resistance
25 C30
V
k
X
RIN comm
Input Common-Mode Resistance
25 C10
V
M
X
CIN
Input Capacitance
25 C2
V
pF
VCMa
Positive Common-Mode
Full
10
13
II
V
Input Range
VCMb
Negative Common-Mode
Full
b
9
b
12
II
V
Input Range
AVOL
Large Signal Voltage Gain
25 C
4000
8000
I
VV
VO e 08V to 20V
Full
3000
III
VV
2
TD
is
33in