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參數(shù)資料
| 型號(hào)： | ECCM3RA08-40.000M |
| 廠商： | ECLIPTEK CORP |
| 元件分類(lèi)： | 晶體 |
| 英文描述： | QUARTZ CRYSTAL RESONATOR, 40 MHz |
| 封裝： | ROHS COMPLIANT, CERAMIC, SMD, 4 PIN |
| 文件頁(yè)數(shù)： | 2/2頁(yè) |
| 文件大?。?/td> | 232K |
| 代理商： | ECCM3RA08-40.000M |
MECHANICAL DIMENSIONS
ALL DIMENSIONS IN MILLIMETERS
1.60
±0.10
MARKING SPECIFICATIONS
ENVIRONMENTAL/MECHANICAL SPECIFICATIONS
MANUFACTURER
ECLIPTEK CORP.
CATEGORY
CRYSTAL
SERIES
PACKAGE
CLASS
REV
.
DATE
ECCM3
CERAMIC
CR59 01/10
SUGGESTED SOLDER PAD LAYOUT
ALL DIMENSIONS IN MILLIMETERS
TAPE AND REEL DIMENSIONS
ALL DIMENSIONS IN MILLIMETERS
M N O P Q
1.5 MIN 50 MIN 20.2 MIN 13±.2 40 MIN
R S T U V
QTY/REEL
2.5 MIN
10 MIN 14.4 MAX 180 MAX 8.4+1.5-0 1,000
REEL
8±.2 3.5±.1 2.75±.1 4 ±.1 2±.1
\
F G H J K L
4±.1 1.85±1.0 1.55±.05 2.25±.1 .25 ±.05 .65±1.0
A B C D E
TAPE
*Compliant to EIA-481A
PACKAGING OPTIONS
Blank=Bulk, TR=Tape and Reel
FREQUENCY
PART NUMBERING GUIDE
ECCM3 Q A 12 - 24.000M TR
LOAD CAPACITANCE
08=8pF Parallel Resonant
12=12pF Parallel Resonant
FREQUENCY TOLERANCE/STABILITY
Q=±10ppm at 25°C, ±15ppm over -30°C to +85°C
R=±10ppm at 25°C, ±10ppm over -10°C to +60°C
MODE OF OPERATION
A=Fundamental
Line 1: XX.X
Frequency in MHz
(3 Digits Maximum + Decimal)
Line 2: XXX
Ecliptek Manufacturing Identifier
800-ECLIPTEK www.ecliptek.com for latest revision
Specifications subject to change without notice.
2.00
±0.10
0.4 MAX
0.50 ±0.10
0.64
±0.10
M
O
1
2
3
4
0.55 ±0.10 (X4)
Pad 1: Input/Output
Pad 2: Cover/Ground
Pad 3: Input/Output
Pad 4: Cover/Ground
0.68
±0.10
(X4)
All Tolerances are ±0.1
Solder Land
(X4)
0.5
0.3
0.8 (X4)
0.9 (X4)
PARAMETER
SPECIFICATION
ESD Susceptibility
Fine Leak Test
Gross Leak Test
Flammability
Mechanical Shock
Moisture Resistance
Moisture Sensitivity
Resistance to Soldering Heat
Resistance to Solvents
Solderability
Temperature Cycling
Vibration
MIL-STD-883, Method 3015, Class 1, HBM: 1500V
MIL-STD-883, Method 1014, Condition A
MIL-STD-883, Method 1014, Condition C
UL94-V0
MIL-STD-883, Method 2002, Condition B
MIL-STD-883, Method 1004
J-STD-020, MSL 1
MIL-STD-202, Method 210, Condition K
MIL-STD-202, Method 215
MIL-STD-883, Method 2003
MIL-STD-883, Method 1010, Condition B
MIL-STD-883, Method 2007, Condition A
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