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參數資料
| 型號： | DS3154+ |
| 廠商： | Maxim Integrated Products |
| 文件頁數： | 28/61頁 |
| 文件大?。?/td> | 0K |
| 描述： | IC LIU DS3/E3/STS1 QUAD 144CSBGA |
| 產品培訓模塊： | Lead (SnPb) Finish for COTS Obsolescence Mitigation Program |
| 標準包裝： | 160 |
| 類型： | 線路接口裝置（LIU） |
| 驅動器/接收器數： | 4/4 |
| 規(guī)程： | IEEE 1149.1 |
| 電源電壓： | 3.135 V ~ 3.465 V |
| 安裝類型： | 表面貼裝 |
| 封裝/外殼： | 144-BGA，CSPBGA |
| 供應商設備封裝： | 144-TECSBGA（13x13） |
| 包裝： | 管件 |
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DS3151/DS3152/DS3153/DS3154 Single/Dual/Triple/Quad DS3/E3/STS-1 LIUs
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Shift-DR. The test data register selected by the current instruction is connected between JTDI and JTDO and shifts
data one stage toward its serial output on each rising edge of JTCLK. If a test register selected by the current
instruction is not placed in the serial path, it maintains its previous state.
Exit1-DR. While in this state, a rising edge on JTCLK with JTMS high puts the controller in the Update-DR state,
which terminates the scanning process. A rising edge on JTCLK with JTMS low puts the controller in the Pause-DR
state.
Pause-DR. Shifting of the test registers is halted while in this state. All test registers selected by the current
instruction retain their previous state. The controller remains in this state while JTMS is low. A rising edge on
JTCLK with JTMS high puts the controller in the Exit2-DR state.
Exit2-DR. While in this state, a rising edge on JTCLK with JTMS high puts the controller in the Update-DR state
and terminates the scanning process. A rising edge on JTCLK with JTMS low puts the controller in the Shift-DR
state.
Update-DR. A falling edge on JTCLK while in the Update-DR state latches the data from the shift register path of
the test registers into the data output latches. This prevents changes at the parallel output because of changes in
the shift register. A rising edge on JTCLK with JTMS low puts the controller in the Run-Test-Idle state. With JTMS
high, the controller enters the Select-DR-Scan state.
Select-IR-Scan. All test registers retain their previous state. The instruction register remains unchanged during this
state. With JTMS low, a rising edge on JTCLK moves the controller into the Capture-IR state and initiates a scan
sequence for the instruction register. JTMS high during a rising edge on JTCLK puts the controller back into the
Test-Logic-Reset state.
Capture-IR. The Capture-IR state is used to load the shift register in the instruction register with a fixed value. This
value is loaded on the rising edge of JTCLK. If JTMS is high on the rising edge of JTCLK, the controller enters the
Exit1-IR state. If JTMS is low on the rising edge of JTCLK, the controller enters the Shift-IR state.
Shift-IR. In this state, the instruction register’s shift register is connected between JTDI and JTDO and shifts data
one stage for every rising edge of JTCLK toward the serial output. The parallel register and the test registers
remain at their previous states. A rising edge on JTCLK with JTMS high moves the controller to the Exit1-IR state.
A rising edge on JTCLK with JTMS low keeps the controller in the Shift-IR state, while moving data one stage
through the instruction shift register.
Exit1-IR. A rising edge on JTCLK with JTMS low puts the controller in the Pause-IR state. If JTMS is high on the
rising edge of JTCLK, the controller enters the Update-IR state and terminates the scanning process.
Pause-IR. Shifting of the instruction register is halted temporarily. With JTMS high, a rising edge on JTCLK puts
the controller in the Exit2-IR state. The controller remains in the Pause-IR state if JTMS is low during a rising edge
on JTCLK.
Exit2-IR. A rising edge on JTCLK with JTMS high puts the controller in the Update-IR state. The controller loops
back to the Shift-IR state if JTMS is low during a rising edge of JTCLK in this state.
Update-IR. The instruction shifted into the instruction shift register is latched into the parallel output on the falling
edge of JTCLK as the controller enters this state. Once latched, this instruction becomes the current instruction. A
rising edge on JTCLK with JTMS low puts the controller in the Run-Test-Idle state. With JTMS high, the controller
enters the Select-DR-Scan state.
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相關代理商/技術參數 |
參數描述 |
|---|---|
| DS3154+ | 功能描述:網絡控制器與處理器 IC Quad DS3/E3/STS-1 Line Interface Unit RoHS:否 制造商:Micrel 產品:Controller Area Network (CAN) 收發(fā)器數量: 數據速率: 電源電流（最大值）:595 mA 最大工作溫度:+ 85 C 安裝風格:SMD/SMT 封裝 / 箱體:PBGA-400 封裝:Tray |
| DS3154A2 | 功能描述:網絡控制器與處理器 IC Quad DS3/E3/STS-1 Line Interface Unit RoHS:否 制造商:Micrel 產品:Controller Area Network (CAN) 收發(fā)器數量: 數據速率: 電源電流（最大值）:595 mA 最大工作溫度:+ 85 C 安裝風格:SMD/SMT 封裝 / 箱體:PBGA-400 封裝:Tray |
| DS3154DK | 功能描述:網絡開發(fā)工具 DS3154 Dev Kit RoHS:否 制造商:Rabbit Semiconductor 產品:Development Kits 類型:Ethernet to Wi-Fi Bridges 工具用于評估:RCM6600W 數據速率:20 Mbps, 40 Mbps 接口類型:802.11 b/g, Ethernet 工作電源電壓:3.3 V |
| DS3154N | 功能描述:網絡控制器與處理器 IC Quad DS3/E3/STS-1 Line Interface Unit RoHS:否 制造商:Micrel 產品:Controller Area Network (CAN) 收發(fā)器數量: 數據速率: 電源電流（最大值）:595 mA 最大工作溫度:+ 85 C 安裝風格:SMD/SMT 封裝 / 箱體:PBGA-400 封裝:Tray |
| DS3154N# | 功能描述:網絡控制器與處理器 IC Quad DS3/E3/STS-1 Line Interface Unit RoHS:否 制造商:Micrel 產品:Controller Area Network (CAN) 收發(fā)器數量: 數據速率: 電源電流（最大值）:595 mA 最大工作溫度:+ 85 C 安裝風格:SMD/SMT 封裝 / 箱體:PBGA-400 封裝:Tray |
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