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參數(shù)資料
| 型號： | DS21354LN |
| 廠商： | DALLAS SEMICONDUCTOR |
| 元件分類： | 數(shù)字傳輸電路 |
| 英文描述： | 3.3V/5V E1 Single-Chip Transceivers |
| 中文描述： | DATACOM, PCM TRANSCEIVER, PQFP100 |
| 封裝： | 14 X 14 MM, LQFP-100 |
| 文件頁數(shù)： | 3/4頁 |
| 文件大小： | 17K |
| 代理商： | DS21354LN |
The calculated failure rate for this device/process is:
The parameters used to calculate this failure rate are as follows:
Cf: 60%
Ea: 0.7
B: 0
Tu: 25
Vu: 5.5
°C
Volts
The reliability data follows. A the start of this data is the device information. The next section is the
detailed reliability data for each stress. The reliability data section includes the latest data available
and may contain some generic data.
Failure Rates are reported in FITs (Failures in Time) or MTTF (Mean Time To Failure). The FIT rate
is related to MTTF by:
MTTF = 1/Fr
NOTE: MTTF is frequently used interchangeably with MTBF.
FITS:
12.6
MTTF (YRS): 9048
FAILURE RATE:
Device Information:
Process:
Passivation:
Die Size:
8"-D6H-2P2M,HPVt,TCN1 ALOCOS:GOI
Passivation w/OxyNitride-Nov. 4% PSG
293 x 311
Number of Transistors:
Interconnect:
Gate Oxide Thickness:
172615
Aluminum / 1% Silicon / 0.5% Copper
150
ELECTRICAL CHARACTERIZATION
DESCRIPTION
READPOINT
CONDITION
QUANTITY
FAILS
DATE CODE
1
EOS/ESD S5.1 HBM 500 VOLTS
3
0
ESD SENSITIVITY
PUL'S
0336
1
EOS/ESD S5.1 HBM 1000 VOLTS
3
0
ESD SENSITIVITY
PUL'S
0336
1
EOS/ESD S5.1 HBM 2000 VOLTS
3
0
ESD SENSITIVITY
PUL'S
0336
1
EOS/ESD S5.1 HBM 4000 VOLTS
3
0
ESD SENSITIVITY
PUL'S
0336
1
EOS/ESD S5.1 HBM 8000 VOLTS
3
3
ESD SENSITIVITY
PUL'S
0336
JESD78, I-TEST 125C
6
0
LATCH-UP
0336
JESD78, Vsupply TEST 125C
6
0
3
LATCH-UP
0336
Total:
OPERATING LIFE
DESCRIPTION
READPOINT
CONDITION
QUANTITY
FAILS
DATE CODE
1000
125C, 5.25 VOLTS
77
0
0
HIGH TEMP OP LIFE
HRS
0336
Total:
TEMPERATURE CYCLE
DESCRIPTION
READPOINT
CONDITION
QUANTITY
FAILS
DATE CODE
1000
-55C TO 125C
77
0
0
TEMP CYCLE
CYS
0336
Total:
TEMPERATURE HUMIDITY BIAS
DESCRIPTION
READPOINT
CONDITION
QUANTITY
FAILS
DATE CODE
96
130C, 85%R.H.,3.5V
77
0
HAST
HRS
0336
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相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| DS21354LN+ | 功能描述:網(wǎng)絡(luò)控制器與處理器 IC 3.3/5V E1 Single Chip Transceiver RoHS:否 制造商:Micrel 產(chǎn)品:Controller Area Network (CAN) 收發(fā)器數(shù)量: 數(shù)據(jù)速率: 電源電流（最大值）:595 mA 最大工作溫度:+ 85 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:PBGA-400 封裝:Tray |
| DS21372 | 制造商:DALLAS 制造商全稱:Dallas Semiconductor 功能描述:3.3V Bit Error Rate Tester BERT |
| DS21372T | 功能描述:網(wǎng)絡(luò)控制器與處理器 IC 3.3V Bit Error Rate Tester (BERT) RoHS:否 制造商:Micrel 產(chǎn)品:Controller Area Network (CAN) 收發(fā)器數(shù)量: 數(shù)據(jù)速率: 電源電流（最大值）:595 mA 最大工作溫度:+ 85 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:PBGA-400 封裝:Tray |
| DS21372T+ | 功能描述:網(wǎng)絡(luò)控制器與處理器 IC 3.3V Bit Error Rate Tester (BERT) RoHS:否 制造商:Micrel 產(chǎn)品:Controller Area Network (CAN) 收發(fā)器數(shù)量: 數(shù)據(jù)速率: 電源電流（最大值）:595 mA 最大工作溫度:+ 85 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:PBGA-400 封裝:Tray |
| DS21372TN | 功能描述:網(wǎng)絡(luò)控制器與處理器 IC 3.3V Bit Error Rate Tester (BERT) RoHS:否 制造商:Micrel 產(chǎn)品:Controller Area Network (CAN) 收發(fā)器數(shù)量: 數(shù)據(jù)速率: 電源電流（最大值）:595 mA 最大工作溫度:+ 85 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:PBGA-400 封裝:Tray |
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