參數(shù)資料
型號: CLC021AVGZ-3.3
廠商: NATIONAL SEMICONDUCTOR CORP
元件分類: 消費家電
英文描述: SMPTE 259M Digital Video Serializer with EDH Generation and Insertion
中文描述: SPECIALTY CONSUMER CIRCUIT, PQFP44
封裝: PLASTIC, QFP-44
文件頁數(shù): 10/18頁
文件大小: 428K
代理商: CLC021AVGZ-3.3
Device Operation
(Continued)
BUILT-IN SELF-TEST (BIST)
The CLC021 has a
built-in self-test (BIST)
function. The
BIST performs a comprehensive go/no-go test of the device.
The test uses either a full-field colour bar for NTSC or a PLL
pathological for PAL as the test data pattern. Data is input
internally in the input data register, processed through the
device and tested for errors. A go/no-go indication is given at
the Test_Output.
Table 1
gives device pin functions and
Table 2
gives the test pattern codes used for this function.
The signal level at Test_Output, pin 3, indicates a pass or fail
condition.
The BIST is initiated by applying the code for the desired
BIST to D0 through D3 (D9 through D4 are 00h) and a 27
MHz clock at the P
CLK
input. Since all parallel data inputs are
equipped with an internal pull-down device, only those inputs
D0 through D3 which require a logic-1 need be pulled high.
After the Lock_Detect output goes high indicating the VCO is
locked on frequency, TPG_Enable, pin 29, is taken to a logic
high. The Lock_Detect output may be temporarily connected
to TPG_Enable to automate BIST operation. Test_Output,
pin 3, is monitored for a pass/fail indication. If no errors have
been detected, this output will go to a logic high level ap-
proximately 2 field intervals after TPG_Enable is taken high.
If errors have been detected in the internal circuitry of the
CLC021, Test_Output will remain low until the test is termi-
nated. The BIST is terminated by taking TPG _Enable to a
logic low. Continuous serial data output is available during
the test.
10136815
FIGURE 4. Power-On Reset Sequence
10136814
FIGURE 5. Power-On Reset Sequence with Manual Reset
C
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