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DEVICE SELECTION
The CDC421xxx device is an LVPECL low-phase-noise clock generator designed to work with a low-frequency
AT-crystal oscillator of a single-ended LVCMOS.
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range (unless otherwise noted)
(1)
CDC421xxx
SLAS540–APRIL 2007
Table 1. TERMINAL FUNCTIONS (continued)
TERMINAL
ESD
TYPE
DESCRIPTION
PROTECTION
NAME
NO.
Chip enable (LVCMOS input)
CE = 1 enables the device and the outputs.
CE = 0 disables all current sources (LVPECLP = LVPECLN = Hi-Z).
High-speed positive differential LVPECL output. (Outputs are enabled by CE )
High-speed negative differential LVPECL output. (Outputs are enabled by CE )
CE
1
I
Y
OUTP
OUTN
10
7
O
O
Y
Y
2–6, 11–15,
18–20, 23,
24
NC
I or O
Y
TI test pin. Do not connect; leave floating.
Table 2. Device Selection Table for CDC421xxx
CDC421xxx
OUTPUT FREQUENCY FOR
THE SPECIFIED INPUT
FREQUENCY (MHz)
INPUT FREQUENCY OR
CRYSTAL VALUE (MHz)
PACKAGE
DEVICE
MARKING
421100
421100
421106
421106
421125
421125
421156
421156
421212
421212
421250
421250
421312
421312
ORDERING
PART NUMBER
CDC421100RGER
CDC421100RGET
CDC421106RGER
CDC421106RGET
CDC421125RGER
CDC421125RGET
CDC421156RGER
CDC421156RGET
CDC421212RGER
CDC421212RGET
CDC421250RGER
CDC421250RGET
CDC421312RGER
CDC421312RGET
QFN-24 tape and reel
QFN-24 small tape and reel
QFN-24 tape and reel
QFN-24 small tape and reel
QFN-24 tape and reel
QFN-24 small tape and reel
QFN-24 tape and reel
QFN-24 small tape and reel
QFN-24 tape and reel
QFN-24 small tape and reel
QFN-24 tape and reel
QFN-24 small tape and reel
QFN-24 tape and reel
QFN-24 small tape and reel
33.3333
33.3333
35.4167
35.4167
31.2500
31.2500
31.2500
31.2500
35.4167
35.4167
31.2500
31.2500
31.2500
31.2500
100.00
100.00
106.25
106.25
125.00
125.00
156.25
156.25
212.50
212.50
250.00
250.00
312.50
312.50
VALUE
–0.5 to 4.6
–0.5 to V
CC
+ 0.5
–50
2 k
–40 to 85
125
–65 to 150
UNIT
V
V
mA
V
°
C
°
C
°
C
V
CC
V
I
I
O
Supply voltage
(2)
Voltage range for all other input pins
(2)
Output current for LVPECL
Electrostatic discharge (HBM)
Characterized free-air temperature range (no airflow)
Maximum junction temperature
Storage temperature range
T
A
T
J
T
stg
(1)
Stresses beyond those listed under
absolute maximum ratings
may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under
recommended operating
conditions
is not implied. Exposure to absolute-maximum rated conditions for extended periods may affect device reliability.
All voltage values are with respect to network ground terminal.
(2)
3
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