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參數(shù)資料
| 型號： | CD40162BMS |
| 廠商： | Intersil Corporation |
| 英文描述： | Single 2-Input Positive-AND Gate 5-SOT-23 -40 to 85 |
| 中文描述： | 同步可編程的CMOS 4位計(jì)數(shù)器 |
| 文件頁數(shù)： | 5/13頁 |
| 文件大?。?/td> | 156K |
| 代理商： | CD40162BMS |
4-5
Minimum Clear Removal
Time
(CD40160BMS,
CD40161BMS)
TREM
VDD = 5V
1, 2, 3
+25
o
C
+25
o
C
+25
o
C
-
200
ns
VDD = 10V
1, 2, 3
-
100
ns
VDD = 15V
1, 2, 3
-
70
ns
NOTES:
1. All voltages referenced to device GND.
2. The parameters listed on Table 3 are controlled via design or process and are not directly tested. These parameters are characterized on initial
design release and upon design changes which would affect these characteristics.
3. CL = 50pF, RL = 200K, Input TR, TF < 20ns.
4. If more than one unit is cascaded, TRCL should be made less than or equal to the sumof the transition time and the fixed propagation delay of
the output of the driving stage for the estimated capacitive load.
TABLE 4. POST IRRADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS
PARAMETER
SYMBOL
CONDITIONS
NOTES
TEMPERATURE
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
LIMITS
UNITS
MIN
MAX
Supply Current
IDD
VDD = 20V, VIN = VDD or GND
1, 4
-
25
μ
A
N Threshold Voltage
VNTH
VDD = 10V, ISS = -10
μ
A
VDD = 10V, ISS = -10
μ
A
VSS = 0V, IDD = 10
μ
A
VSS = 0V, IDD = 10
μ
A
1, 4
-2.8
-0.2
V
N Threshold Voltage Delta
VTN
1, 4
-
±
1
V
P Threshold Voltage
VTP
1, 4
0.2
2.8
V
P Threshold Voltage Delta
VTP
1, 4
-
±
1
V
Functional
F
VDD = 18V, VIN = VDD or GND
1
VOH >
VDD/2
VOL <
VDD/2
V
VDD = 3V, VIN = VDD or GND
Propagation Delay Time
TPHL
TPLH
VDD = 5V
1, 2, 3, 4
+25
o
C
-
1.35 x
+25
o
C
Limit
ns
NOTES: 1. All voltages referenced to device GND.
2. CL = 50pF, RL = 200K, Input TR, TF < 20ns.
3. See Table 2 for +25
o
C limit.
4. Read and Record
TABLE 5. BURN-IN AND LIFE TEST DELTA PARAMETERS +25
o
C
PARAMETER
SYMBOL
DELTA LIMIT
Supply Current - MSI-2
IDD
±
1.0
μ
A
±
20% x Pre-Test Reading
±
20% x Pre-Test Reading
Output Current (Sink)
IOL5
Output Current (Source)
IOH5A
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUP
MIL-STD-883
METHOD
GROUP A SUBGROUPS
READ AND RECORD
Initial Test (Pre Burn-In)
100% 5004
1, 7, 9
IDD, IOL5, IOH5A
Interim Test 1 (Post Burn-In)
100% 5004
1, 7, 9
IDD, IOL5, IOH5A
Interim Test 2 (Post Burn-In)
100% 5004
1, 7, 9
IDD, IOL5, IOH5A
PDA (Note 1)
100% 5004
1, 7, 9, Deltas
Interim Test 3 (Post Burn-In)
100% 5004
1, 7, 9
IDD, IOL5, IOH5A
PDA (Note 1)
100% 5004
1, 7, 9, Deltas
Final Test
100% 5004
2, 3, 8A, 8B, 10, 11
Group A
Sample 5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
Group B
Subgroup B-5
Sample 5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
Subgroups 1, 2, 3, 9, 10, 11
Subgroup B-6
Sample 5005
1, 7, 9
Group D
Sample 5005
1, 2, 3, 8A, 8B, 9
Subgroups 1, 2 3
NOTE: 1. 5% Parameteric, 3% Functional; Cumulative for Static 1 and 2.
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)
PARAMETER
SYMBOL
CONDITIONS
NOTES
TEMPERATURE
LIMITS
UNITS
MIN
MAX
CD40160BMS, CD40161BMS, CD40162BMS, CD40163BMS
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| CD40163BCJ | 制造商:NSC 制造商全稱:National Semiconductor 功能描述:Decade Counter with Asynchronous Clear |
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