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參數資料
| 型號： | CCR25.0MX7JT3 |
| 元件分類： | 陶瓷諧振器 |
| 英文描述： | CERAMIC RESONATOR, 25 MHz |
| 封裝： | SMD, 6 PIN |
| 文件頁數： | 3/3頁 |
| 文件大?。?/td> | 66K |
| 代理商： | CCR25.0MX7JT3 |
All specifications are subject to change without notice.
(3/3)
001-05 / 20060110 / ef31_ccr.fm
Piezoelectronic Products
CCR Series
Ceramic Resonators
SMD
TYPICAL ELECTRICAL CHARACTERISTICS
OSCILLATING FREQUENCY DRIFT OVER TEMPERATURE
MUC8/MXC8: ±0.3%/–40 to +85°C(Standard)
CCR8.0MXC8
MXC7: ±0.2%/–40 to +85°C(Standard)
CCR48.0MXC7
OSCILLATING FREQUENCY AGING
MUC8/MXC8: ±0.3%/10years(Standard)
CCR8.0MXC8
MXC7: ±0.1%/10years(Standard)
CCR48.0MXC7
RECOMMENDED SOLDERING CONDITIONS
REFLOW SOLDERING
RELIABILITY AND TEST CONDITIONS
The following test items are satisfied.
(1) Oscillating frequency change: Within ±0.25%
(2) Resonant resistance change: Within ±10
(3) Appearance; serious abnormalities not to exist.
0.5
0.4
0.3
0.2
0.1
0
–0.1
–0.2
–0.3
–0.4
–0.5
–50
–25
0
255075
100
Temperature(C)
Fosc/Fosc
( %
)
–0.20
–0.15
–0.10
–0.05
0.00
0.05
0.10
0.15
0.20
Fosc/Fosc
( %
)
–50
–30
–10 030
10
50
70
90
Temperature(C)
0.5
0.4
0.3
0.2
0.1
0
–0.1
–0.2
–0.3
–0.4
–0.5
110
100
1000
10000
100000
Time(hrs)
Fosc/Fosc
( %
)
–0.10
–0.08
–0.06
–0.04
–0.02
0.00
0.02
0.04
0.06
0.08
0.10
Fosc/Fosc
( %
)
0.1
1
100
10
1000
10000
Time(hrs)
Preheating: 60s min.
(2)
200C
(1)
Time(s)
60s max.
10s max.
Test items
Test conditions
Low temperature storage
Temperature: –40±3°C
Time: 1000h
High temperature storage
Temperature: +85±2°C
Time: 1000h
Loading humidity resistance
Humidity: 90 to 95(%)RH
Temperature: 60±2°C
Time: 1000h
Thermal shock
–40°C (30min), 85°C (30min) x 100 cycles
Soldering heat resistance
Solder temperature: peak 260°C, 10s
reflow
Drop
Drop 3 times onto the concrete from a
height of 1m
Vibration
Frequency: 10
55 10Hz/min
Amplitude: 1.5mm
X, Y and Z directions for 2h each
Board bend test
Solder this product onto a glass epoxy
board (L100
×W40×T1.6mm), press it by up
to 1mm in 1mm/s and keep it for 5sec.
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|---|---|
| CCR251 | 制造商:Microsemi Corporation 功能描述:CURRENT LIMITER DIODE SEE_FACTORY LAW - Bulk |
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