
CAT93C46R
2
Doc. No. 1107, Rev. F
2006 by Catalyst Semiconductor, Inc.
Characteristics subject to change without notice
D.C. OPERATING CHARACTERISTICS
V
CC
= +1.8V to +5.5V, unless otherwise specified.
Symbol
Parameter
Test Conditions
Min
Max
Units
I
CC1
Power Supply Current
(Write)
f
SK
= 1MHz
V
CC
= 5.0V
1
mA
I
CC2
Power Supply Current
(Read)
f
SK
= 1MHz
V
CC
= 5.0V
500
μ
A
I
SB1
Power Supply Current
(Standby) (x8 Mode)
CS = 0V
ORG = GND
10
μ
A
I
SB2
Power Supply Current
(Standby) (x16Mode)
CS = 0V
10
μ
A
ORG = Float or V
CC
I
LI
Input Leakage Current
V
IN
= 0V to V
CC
2
μ
A
μ
A
I
LO
Output Leakage Current
(Including ORG pin)
V
OUT
= 0V to V
CC
,
CS = 0V
2
V
IL1
Input Low Voltage
4.5V
≤
V
CC
< 5.5V
4.5V
≤
V
CC
< 5.5V
1.8V
≤
V
CC
< 4.5V
1.8V
≤
V
CC
< 4.5V
4.5V
≤
V
CC
< 5.5V
I
OL
= 2.1mA
4.5V
≤
V
CC
< 5.5V
I
OH
= -400
μ
A
1.8V
≤
V
CC
< 4.5V
I
OL
= 1mA
1.8V
≤
V
CC
< 4.5V
I
OH
= -100
μ
A
-0.1
0.8
V
V
IH1
Input High Voltage
2
V
CC
+ 1
V
V
IL2
Input Low Voltage
0
V
CC
x 0.2
V
V
IH2
Input High Voltage
V
CC
x 0.7
V
CC
+1
V
V
OL1
Output Low Voltage
0.4
V
V
OH1
Output High Voltage
2.4
V
V
OL2
Output Low Voltage
0.2
V
V
OH2
Output High Voltage
V
CC
- 0.2
V
ABSOLUTE MAXIMUM RATINGS
(1)
Storage Temperature
Voltage on Any Pin with Respect to Ground
(2)
-65
°
C to +150
°
C
-0.5 V to +6.5 V
RELIABILITY CHARACTERISTICS
(3)
l
b
m
y
N
S
r
e
m
n
a
d
a
r
a
n
P
E
n
0
0
M
s
U
a
E
/
D
N
E
T
)
e
c
0
0
0
s
e
y
C
e
s
m
a
o
P
R
D
n
o
e
R
a
D
0
0
1
s
e
Y
Note:
(1) Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions outside of those listed in the operational sections of this
specification is not implied. Exposure to any absolute maximum rating for extended periods may affect device performance and reliability.
(2) The DC input voltage on any pin should not be lower than -0.5V or higher than V
CC
+0.5V. During transitions, the voltage on any pin may
undershoot to no less than -1.5V or overshoot to no more than V
CC
+1.5V, for periods of less than 20 ns.
(3) These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC-Q100
and JEDEC test methods.
(4) Block Mode, V
CC
= 5V, T
A
= 25
°
C.