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參數(shù)資料
| 型號(hào)： | CAT33C804AJA-TE13 |
| 英文描述： | 4K-Bit Secure Access Serial E2PROM |
| 中文描述： | 4K的位安全接入串行E2PROM |
| 文件頁(yè)數(shù)： | 2/14頁(yè) |
| 文件大?。?/td> | 89K |
| 代理商： | CAT33C804AJA-TE13 |
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Preliminary
CAT33C804A
2
Doc. No. 25044-00 2/98
ABSOLUTE MAXIMUM RATINGS*
Temperature Under Bias ................. –55
°
C to +125
°
C
Storage Temperature....................... –65
°
C to +150
°
C
Voltage on Any Pin with
Respect to Ground
(1)
........... –2.0V to +V
CC
+ 2.0V
V
CC
with Respect to Ground ............... –2.0V to +7.0V
Package Power Dissipation
Capability (T
a
= 25
°
C) ................................... 1.0W
Lead Soldering Temperature (10 secs) ............ 300
°
C
Output Short Circuit Current
(2)
........................ 100mA
*COMMENT
Stresses above those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device.
These are stress ratings only, and functional operation of
the device at these or any other conditions outside of those
listed in the operational sections of this specification is not
implied. Exposure to any absolute maximum rating for
extended periods may affect device performance and
reliability.
RELIABILITY CHARACTERISTICS
Symbol
Parameter
Min.
Max.
Units
Reference Test Method
N
END(3)
T
DR(3)
V
ZAP(3)
I
LTH(3)(4)
Endurance
100,000
Cycles/Byte
MIL-STD-883, Test Method 1033
Data Retention
100
Years
MIL-STD-883, Test Method 1008
ESD Susceptibility
2000
Volts
MIL-STD-883, Test Method 3015
Latch-up
100
mA
JEDEC Standard 17
Note:
(1) The minimum DC input voltage is –0.5V. During transitions, inputs may undershoot to –2.0V for periods of less than 20 ns. Maximum DC
voltage on output pins is V
CC
+0.5V, which may overshoot to V
CC
+ 2.0V for periods of less than 20ns.
(2) Output shorted for no more than one second. No more than one output shorted at a time.
(3) This parameter is tested initially and after a design or process change that affects the parameter.
(4) Latch-up protection is provided for stresses up to 100 mA on address and data pins from –1V to V
CC
+1V.
(5) PE pin test conditions: V
IH
< V
IN
< V
IL
D.C. CHARACTERISTICS
V
CC
= +3V
±
10%,unless otherwise specified.
Limits
Symbol
Parameter
Min.
Typ.
Max.
Units
Test Conditions
I
CC
Power Supply Current
(Operating)
3
mA
V
CC
= 3.3V, CS = V
CC
DO is Unloaded.
I
SB
Power Supply Current
(Standby)
250
μ
A
V
CC
= 3.3V, CS = 0V
DI = 0V, CLK = 0V
V
IL
Input Low Voltage
–0.1
0.8
V
V
IH
Input High Voltage
2
V
V
OL
Output Low Voltage
0.4
V
I
OL
= 2.1mA
V
OH
Output High Voltage
2.4
V
I
OH
= –400
μ
A
I
LI(5)
Input Leakage Current
2
μ
A
μ
A
V
IN
= 3.3V
I
LO
Output Leakage Current
10
V
OUT
= 3.3V, CS = 0V
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相關(guān)代理商/技術(shù)參數(shù) |
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|---|---|
| CAT33C804AJITE13 | 制造商:CATALYST 制造商全稱:Catalyst Semiconductor 功能描述:4K-Bit Secure Access Serial E2PROM |
| CAT33C804AJI-TE13 | 制造商:CATALYST 制造商全稱:Catalyst Semiconductor 功能描述:4K-Bit Secure Access Serial E2PROM |
| CAT33C804AJI-TE7 | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:Serial EEPROM |
| CAT33C804AJTE13 | 制造商:CATALYST 制造商全稱:Catalyst Semiconductor 功能描述:4K-Bit Secure Access Serial E2PROM |
| CAT33C804AJ-TE13 | 制造商:CATALYST 制造商全稱:Catalyst Semiconductor 功能描述:4K-Bit Secure Access Serial E2PROM |
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