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參數(shù)資料
| 型號： | CAT1023WI-25-GT2 |
| 元件分類： | EEPROM |
| 英文描述： | The CAT24FC02 is a 2-kb Serial CMOS EEPROM internally organized as 256 words of 8 bits each |
| 中文描述： | 該CAT24FC02是一個2 KB的EEPROM的國內(nèi)256個8位每字舉辦的串行CMOS |
| 文件頁數(shù)： | 6/21頁 |
| 文件大?。?/td> | 278K |
| 代理商： | CAT1023WI-25-GT2 |
CAT1021, CAT1022, CAT1023
Doc. No. 3009 Rev. L
6
2007 Catalyst Semiconductor, Inc.
Characteristics subject to change without notice
RESET CIRCUIT AC CHARACTERISTICS
Symbol
t
PURST
t
RDP
t
GLITCH
MR Glitch
t
MRW
t
MRD
t
WD
Parameter
Power-Up Reset Timeout
V
TH
to RESET output Delay
V
CC
Glitch Reject Pulse Width
Manual Reset Glitch Immunity
MR Pulse Width
MR Input to RESET Output Delay
Watchdog Timeout
Test Conditions
Note 2
Note 3
Note 4, 5
Note 1
Note 1
Note 1
Note 1
Min
130
5
1.0
Typ
200
1.6
Max
270
5
30
100
1
2.1
Units
ms
μs
ns
ns
μs
μs
sec
POWER-UP TIMING
(5), (6)
Symbol
t
PUR
t
PUW
Parameter
Power-Up to Read Operation
Power-Up to Write Operation
Test Conditions
Min
Typ
Max
270
270
Units
ms
ms
AC TEST CONDITIONS
Parameter
Input Pulse Voltages
Input Rise and Fall times
Input Reference Voltages
Output Reference Voltages
Output Load
Test Conditions
0.2V
CC
to 0.8V
CC
10ns
0.3V
CC
, 0.7V
CC
0.5V
CC
Current Source: I
OL
= 3mA; C
L
= 100pF
RELIABILITY CHARACTERISTICS
Symbol
Parameter
N
END
Endurance
T
DR
Data Retention
V
ZAP
ESD Susceptibility
I
LTH
Latch-Up
Reference Test Method
MIL-STD-883, Test Method 1033
MIL-STD-883, Test Method 1008
MIL-STD-883, Test Method 3015
JEDEC Standard 17
Min
Max
Units
Cycles/Byte
Years
Volts
mA
(5)
(5)
(5)
(5)(7)
1,000,000
100
2000
100
Notes:
(1) Test Conditions according to “AC Test Conditions” table.
(2) Power-up, Input Reference Voltage V
CC
= V
TH
, Reset Output Reference Voltage and Load according to “AC Test Conditions” Table
(3) Power-Down, Input Reference Voltage V
CC
= V
TH
, Reset Output Reference Voltage and Load according to “AC Test Conditions” Table
(4) V
CC
Glitch Reference Voltage = V
THmin
; Based on characterization data
(5) This parameter is characterized initially and after a design or process change that affects the parameter. Not 100% tested.
(6) t
PUR
and t
PUW
are the delays required from the time V
CC
is stable until the specified memory operation can be initiated.
(7) Latch-up protection is provided for stresses up to 100mA on input and output pins from -1V to V
CC
+ 1V.
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相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| CAT1023WI-25-GT3 | 功能描述:監(jiān)控電路 CPU SUP W/2K EEPROM RoHS:否 制造商:STMicroelectronics 監(jiān)測電壓數(shù): 監(jiān)測電壓: 欠電壓閾值: 過電壓閾值: 輸出類型:Active Low, Open Drain 人工復位:Resettable 監(jiān)視器:No Watchdog 電池備用開關(guān):No Backup 上電復位延遲（典型值）:10 s 電源電壓-最大:5.5 V 最大工作溫度:+ 85 C 安裝風格:SMD/SMT 封裝 / 箱體:UDFN-6 封裝:Reel |
| CAT1023WI-25T2 | 制造商:CATALYST 制造商全稱:Catalyst Semiconductor 功能描述:Supervisory Circuits with I2C Serial 2k-bit CMOS EEPROM, Manual Reset and Watchdog Timer |
| CAT1023WI-25-T2 | 制造商:CATALYST 制造商全稱:Catalyst Semiconductor 功能描述:Supervisory Circuits with I2C Serial 2k-bit CMOS EEPROM, Manual Reset and Watchdog Timer |
| CAT1023WI-25T3 | 制造商:CATALYST 制造商全稱:Catalyst Semiconductor 功能描述:Supervisory Circuits with I2C Serial 2k-bit CMOS EEPROM, Manual Reset and Watchdog Timer |
| CAT1023WI-25-T3 | 功能描述:監(jiān)控電路 CPU w/2K RoHS:否 制造商:STMicroelectronics 監(jiān)測電壓數(shù): 監(jiān)測電壓: 欠電壓閾值: 過電壓閾值: 輸出類型:Active Low, Open Drain 人工復位:Resettable 監(jiān)視器:No Watchdog 電池備用開關(guān):No Backup 上電復位延遲（典型值）:10 s 電源電壓-最大:5.5 V 最大工作溫度:+ 85 C 安裝風格:SMD/SMT 封裝 / 箱體:UDFN-6 封裝:Reel |
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