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參數(shù)資料
| 型號(hào)： | CA3275E |
| 廠商： | HARRIS SEMICONDUCTOR |
| 元件分類： | 外設(shè)及接口 |
| 英文描述： | Dual Full Bridge Driver |
| 中文描述： | 0.1 A 2 CHANNEL, FULL BRIDGE BASED PRPHL DRVR, PDIP14 |
| 文件頁數(shù)： | 4/5頁 |
| 文件大?。?/td> | 37K |
| 代理商： | CA3275E |
6-6
CA3275
FIGURE 3. SOURCE SWITCHING TEST CIRCUIT AND VOLTAGE WAVEFORMS
FIGURE 4. SINK SWITCHING TEST CIRCUIT AND VOLTAGE WAVEFORMS
COIL
C
L
150
R
L
30pF
DUT
TEST CIRCUIT 1
PWM
DIR
V
S
C
L
INCLUDES PROBE AND TEST CAPACITANCE
COIL OUTPUT
COIL OUTPUT
DIR PULSE
50%
10%
90%
T
SC-ON
T
SC-R
T
SC-OFF
T
SC-F
T
SC-OFF
T
SC-F
T
SC-ON
T
SC-R
10%
10%
90%
90%
TEST CONDITIONS: PWM = 0V, V
S
= 16V
DIR PULSE PARAMETERS:
F = 1kHz, W = 100
μ
s, TR = TF = 1
μ
s, AMPL = 4V
50%
90%
10%
V
S
R
L
150
C
L
30pF
TEST CIRCUIT 2
PWM
DIR
C
L
INCLUDES PROBE AND TEST FIXTURE CAPACITANCE
50%
T
SK-ON
T
SK-R
T
SK-OFF
T
SK-F
10%
90%
PWM PULSE
COIL OUTPUT
PWM PULSE PARAMETERS:
F = 1kHz, W = 100
μ
s, TR = TF = 1
μ
s, AMPL = 4V
DUT
COIL
TEST CONDITIONS: V
S
= 16V
DIR = 0V WHEN TESTING COIL - OUTPUT
DIR = 4V WHEN TESTING COIL + OUTPUT
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