參數資料
型號: CA3060E
廠商: HARRIS SEMICONDUCTOR
元件分類: 運動控制電子
英文描述: 110kHz, Operational Transconductance Amplifier Array
中文描述: TRIPLE OP-AMP, 5000 uV OFFSET-MAX, PDIP16
文件頁數: 6/12頁
文件大?。?/td> 193K
代理商: CA3060E
3-6
FIGURE 13. FORWARD TRANSCONDUCTANCE vs FREQUENCY
FIGURE 14. INPUT RESISTANCE vs AMPLIFIER BIAS CURRENT
FIGURE 15. OUTPUT RESISTANCE vs AMPLIFIER BIAS CURRENT
FIGURE 16. BIAS REGULATOR VOLTAGE vs BIAS
REGULATOR CURRENT
Test Circuit
FIGURE 17. SLEW RATE TEST CIRCUIT FOR AMPLIFIER 1 OF CA3060
Typical Performance Curves
(Continued)
F
P
100
10
1.0
0.1
0.01
0.001
0.01
0.1
1.0
10
100
FREQUENCY (MHz)
0
-50
-100
-150
-200
-250
-300
-350
I
ABC
= 100
μ
A
I
ABC
= 10
μ
A
I
ABC
= 1
μ
A
I
ABC
= 10
μ
A
I
ABC
= 1
μ
A
PHASE ANGLE
FORWARD TRANS.
T
A
= 25
o
C
SUPPLY VOLTAGE:
V
S
=
±
6
V
S
=
±
15
T
A
= 25
o
C, f = 1kHz
SUPPLY VOLTAGE:
V
S
=
±
6
V
S
=
±
15
TYPICAL
MINIMUM
1
10
100
1000
AMPLIFIER BIAS CURRENT (
μ
A)
10,000
1000
100
10
I
)
TYPICAL
1
10
100
1000
AMPLIFIER BIAS CURRENT (
μ
A)
1000
100
10
1
O
)
T
A
= 25
o
C, f = 1kHz
SUPPLY VOLTAGE:
V
S
=
±
6
V
S
=
±
15
7.0
6.75
6.5
6.25
0
200
400
600
800
1000
1200
1400
TYPICAL
T
= 25
o
C
SUPPLY VOLTAGE:
V
S
=
±
6
V
S
=
±
15
B
BIAS REGULATOR CURRENT (
μ
A)
V
Z
is measured between Terminal 1 and 8
V
ABC
is measured between Terminals 15 and 8
Supply Voltage: For both
±
6V and
±
15V
TYPICAL SLEW RATE TEST CIRCUIT PARAMETERS
I
ABC
SLEW
RATE
I
2
R
ABC
R
S
R
F
R
B
R
C
C
C
μ
A
V/
μ
s
μ
A
μ
F
100
8
200
62K
100K
100K
51K
100
0.02
10
1
200
620K
1M
1M
510K
1K
0.005
1
0.1
2
6.2M
10M
10M
5.1M
0
R
Z
2
---------------–
R
ABC
]
,
V
----------------------------
V
ABC
=
=
2
8
1
15
AMPLIFIER
1
13
14
16
R
ABC
I
ABC
10
M
OUT-
PUT
EXTERNAL
LOAD
13
pF
3
V-
V+
R
F
C
C
R
C
R
B
R
S
R
Z
I
2
-
+
IN-
PUT
CA3060
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