參數(shù)資料
型號： C350
廠商： Powerex Power Semiconductors
英文描述： Phase Control SCR 115 Amperes Avg 500-1300 Volts
中文描述： 相位控制晶閘管一百十五安培平均500-1300伏特
文件頁數(shù)： 5/40頁
文件大?。?/td> 580K
代理商： C350
KEMET Electronics Corporation, P.O. Box 5928, Greenville, S.C. 29606, (864) 963-6300
5
KEMET
CERAMIC CONFORMALLY COATED/AXIAL & RADIAL
PERFORMANCE CHARACTERISTICS
GENERAL SPECIFICATIONS
Working Voltage:
C0G
X7R
Z5U
Temperature Characteristics:
C0G
0 ± 30 PPM/°C from - 55°C to + 125°C
(1)
X7R
± 15% from - 55°C to + 125°C
Z5U
+ 22%; - 56% from + 10°C to + 85°C
Capacitance Tolerance:
C0G
± 5%, ± 10%, ± 20%
X7R
± 10%, ± 20%
Z5U
± 20%, - 20 + 80%, - 0 + 100%
Construction:
Epoxy encapsulated - meets flame test require-
ments of UL Standard 94V-0.
High-temperature solder - meets EIA RS-198D,
Method 302, Condition B (260°C for 10 sec.)
Lead Material:
Solder Coated Copper Clad Steel
Solderability:
EIA RS-198D, Method 302, Solder temperature -
230° ± 5°C. Dwell time in solder - 7 ± 1/2 seconds.
Terminal Strength:
EIA RS-198D, Method 303, Condition A (2.2 kg)
ELECTRICAL @ 25°C
Capacitance:
Within specified tolerance at 25°C and following
test conditions.
C0G - Greater than 1000 pF with 1.0 vrms at 1 kHz.
- 1000 pF and less with 1.0 vrms at 1 MHz.
X7R - with 1.0 vrms at 1 kHz.
Z5U - with 0.5 vrms at 1 kHz.
Dissipation Factor:
At 25°C - same test conditions as capacitance.
C0G - 0.15% maximum
X7R - 2.5% maximum
Z5U - 4.0% maximum
Insulation Resistance:
EIA RS-198D, Method 104, Condition A
C0G - 100 gigohms or 1000 megohm x μF,
whichever is less.
X7R -100 gigohms or 1000 megohm x μF,
whichever is less.
Z5U -10 gigohms or 1000 megohm x μF,
whichever is less.
Dielectric Withstanding Voltage:
EIA RS-198D, Method 103 (250% of rated voltage
for 5 seconds, with current limited to 50mA)
ENVIRONMENTAL
Vibration:
EIA RS-198D, Method 304, Condition D (10-2000
Hz; 20g)
Shock:
EIA RS-198D, Method 305, Condition I (100g)
Axial
Radial
50 & 100 volts
50 & 100 volts
50 & 100 volts
100 & 200 volts
50, 100 & 200 volts
50 & 100 volts
Life Test:
EIA RS-198D, Method 201, Condition D. Test
Potential and Temperature.
C0G- 200% of rated voltage at + 125°C
X7R - 200% of rated voltage at + 125°C
Z5U - 200% of rated voltage at + 85°C
Post-Test Limits at + 25°C are:
Capacitance Change:
C0G - ± 3%, or 0.25 pF, whichever is greater.
X7R - ± 20% of initial value.
(2)
Z5U - ± 30% of initial value.
(2)
Dissipation Factor:
C0G - 0.25% maximum
X7R - 3.0% maximum
Z5U - 4.0% maximum
Insulation Resistance:
C0G- 10 gigohms or 100 megohm x μF,
whichever is less.
X7R - 10 gigohms or 100 megohm x μF,
whichever is less.
Z5U - 1 gigohm or 100 megohm x μF,
whichever is less.
Moisture Resistance:
EIA RS-198D, Method 204, Condition A (10 cycles
without applied voltage.
Post-Test Limits at + 25°C are:
Capacitance Change:
C0G - 3%, or 0.25 pF, whichever is greater.
X7R - ± 20% of initial value.
(2)
Z5U - ± 30% of initial value.
(2)
Dissipation Factor:
C0G - 0.25% maximum
X7R - 3.0% maximum
Z5U - 4.0% maximum
Insulation Resistance:
C0G- 10 gigohms or 100 megohm x μF,
whichever is less.
X7R - 10 gigohms or 100 megohm x μF,
whichever is less.
Z5U - 1 gigohm or 100 megohm x μF,
whichever is less.
Thermal Shock:
EIA RS-198D, Method 202, Condition B (C0G &
X7R: - 55°C to + 125°C; Z5U: - 55°C to + 85°C)
(1)
+53 ppm -30 ppm/°C from + 25°C to - 55°C, ± 60
ppm below 10 pF.
X7R & Z5U dielectrics exhibit aging characteristics;
therefore, it is highly recommended that capacitors
be deaged for 2 hours at 150°C and stabilized at
room temperature for 48 hours before capacitance
measurements are made.
(2)
C
A
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