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參數(shù)資料
| 型號： | C2955 |
| 廠商： | Hamamatsu Photonics |
| 英文描述： | INFRARED IC INTERNAL INSPECTION SYSTEM |
| 中文描述： | 紅外集成電路內(nèi)部檢查系統(tǒng) |
| 文件頁數(shù)： | 2/2頁 |
| 文件大?。?/td> | 67K |
| 代理商： | C2955 |
SPECIFICATIONS
G
Infrared CCD Camera (camera head, camera control unit)
Imaging device..............................................2/3-inch infrared CCD
Spectral response .........................................400 nm to 1200 nm
No. of pixels ..................................................380,000
Effective photocathode size......................... 6.3
×
4.7 mm
Power consumption ..................................... 20 VA
G
Video Monitor
CRT...............................................................12-inch/Black and white, high-resolution model
Resolution (horizontal center)...................... 900 TV lines min.
Power consumption ..................................... 38 VA
G
Infrared Microscope
Optical path switching .................................. 100 : 0 / 0 : 100 (eyepiece/camera)
Stage travel area ..........................................153
×
153 mm
Epi-illuminated light source.......................... 12 V, 100 W halogen lamp
Revolver........................................................5 holes
Infrared objectives ........................................10
×
, 20
×
, 50
×
(optional: 5
×
, 100
×
1)
G
Environmental Conditions
Ambient operating temperature range ......... 0 to +40°C
Ambient storage temperature range ............ -10 to +50°C
Ambient operating/storage humidity ............ 90% max. (with no condensation)
Line voltage...................................................100 VAC ± 10%, 50/60 Hz
COMPONENTS
Infrared CCD camera
Camera control unit
Video monitor
Infrared microscope (including light source
dimmer transformer*)
Cables: 1 set
* Specify the line voltage at ordering.
APPLICATIONS
Inspection of flip-chip and other packaged IC
devices
Testing for abnormalities (defects, failures) in
metal and polysilicon wiring
Observation of wire bonding
Observation of various types of die bonding zones
Simultaneous inspection of Al-Si nodules and
multiple patterns
Observation of pattern diffusion into substrate
Identification of ESD failure locations
Subject to local technical requirements and regulations, availability of products included in this promotional material may vary.
Please consult with our sales office.
Information furnished by HAMAMATSU is believed to be reliable. However, no responsibility is assumed for possible inaccuracies
or omissions. Specifications and external appearance are subject to change without notice.
1999 Hamamatsu Photonics K.K.
OPTIONS
C7103 IC Backside Polishing System
IMAGE EXAMPLE
ISO 9001/ISO 13485
CertificEN 46001
Homepage Address http://www.hamamatsu.com
HAMAMATSU PHOTONICS K.K., Systems Division
812 Joko-cho, Hamamatsu City, 431-3196, Japan, Telephone: (81)53-431-0124, Fax: (81)53-435-1574, E-mail:export@sys.hpk.co.jp
U.S.A. and Canada:Hamamatsu Photonic Systems: 360 Foothill Road, Bridgewater, N.J. 08807-0910, U.S.A., Telephone: (1)908-231-1116, Fax: (1)908-231-0852
Germany:Hamamatsu Photonics Deutschland GmbH: Arzbergerstr. 10, D-82211 Herrsching am Ammersee, Germany, Telephone: (49)8152-375-0, Fax: (49)8152-2658
France: Hamamatsu Photonics France S.A.R.L.: 8, Rue du Saule Trapu, Parc du Moulin de Massy, 91882 Massy Cedex, France, Telephone: (33)1 69 53 71 00, Fax: (33)1 69 53 71 10
United Kingdom: Hamamatsu Photonics UK Limited: Lough Point, 2 Gladbeck Way, Windmill Hill, Enfield, Middlesex EN2 7JA, United Kingdom, Telephone: (44)208-367-3560, Fax: (44)208-367-6384
North Europe:Hamamatsu Photonics Norden AB: Smidesvgen 12, SE-171-41 Solna, Sweden, Telephone: (46)8-509-031-00, Fax: (46)8-509-031-01
Italy:Hamamatsu Photonics Italia S.R.L.: Strada della Moia, 1/E 20020 Arese (Milano), Italy, Telephone: (39)02-935 81 733, Fax: (39)02-935 81 741
Cat. No. SSIS 1025E02
JUL/99 CR
Created in Japan (PDF)
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