
Features
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Integrated with back-thinned type CCD image sensor:
Sensitivity is about two orders of magnitude higher than
CMOS type
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High resolution: 1 nm (C10082CAH, C10083CAH)
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High throughput due to transmission grating made of quartz
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Highly accurate optical characteristics
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Wide spectral response range
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Easy to install into equipment
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Wavelength conversion factor *
1
is recorded in internal memory
Applications
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Low-light-level measurement such as fluorescence measurement
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Semiconductor process control
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Evaluation of light source characteristics such as LED
M O D U L E
High sensitivity type (integrated with back-thinned type CCD image sensor)
C10082CA, C10082CAH, C10083CA, C10083CAH
Mini-spectrometer TM series
TM series mini-spectrometers are polychromators integrated with optical elements, an image sensor and a driver circuit. Light to be measured is
guided into the entrance port of TM series through an optical fiber and the spectrum measured with the built-in image sensor is output from the
USB port to a PC for data acquisition. They are high sensitivity mini-spectrometers employing a back-thinned type CCD image sensor. Their
sensitivity is about two orders of magnitudes higher than CMOS type making TM series even more ideal for low-light-level measurement.
C10082CAH and C10083CAH are high resolution type (spectral resolution: 1 nm Typ.).
Mini-spectrometer TM series comes supplied with free sample software that allows setting measurement conditions, acquiring and saving data,
and displaying graphs. Driver software and DLL are also supplied as accessory items to allow the users to configure their own measurement
software.
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Optical characteristics
TM-UV/VIS-CCD
C10082CA
C10082CAH
C10083CA
C10083CAH
200 to 800
TM-VIS/NIR-CCD
Param eter
Unit
Spectral response range
Spectral resolution Max.
(Spectral response half width) *
2
W avelength reproducibility *
5
W avelength tem perature
dependence
Spectral stray light *
2,
*
6
320 to 1000
nm
6
1 *
3
8 *
4
1 *
3,
*
4
nm
±0.2
nm
0.04
nm/° C
-33
-30
dB
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Electrical characteristics
Param eter
A/D conversion
Integration tim e
Interface
USB bus power
current consumption
External power supply
Specification
16
10 to 10000
USB1.1
Unit
bit
m s
-
100
m A
5
V
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General ratings
/
Absolute m aximum ratings
Param eter
Dim ensions
Specification
95 (W ) × 92 (D) × 76 (H)
Back-thinned type CCD image sensor
(S10420-1106)
2048
70 × 800
10 × 1000
0.22
0.11
SMA905D
+5 to +40
-20 to +70
Unit
m m
Im age sensor
-
Num ber of pixels
Slit (H) × (V) *
7
Optical NA
Connector for optical fiber
Operating tem perature *
8
Storage temperature
*1: A conversion factor for converting the image sensor pixel number into a
wavelength is recorded in the m odule. A calculation factor for converting the
A/D converted count into the input light intensity is not provided.
*2: Depends on the slit opening. Values were m easured with the slit listed in the
table “
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General ratings / Absolute m axim um ratings”.
*3: Typical
*4:
λ
=320 to 900 nm
*5: Measured under constant light input conditions
*6: W hen monochromatic light of the following wavelengths is input, spectral stray light is defined as the ratio of the count measured at the input
wavelength, to the count measured in a region of the input wavelength ±40 nm.
C10082CA/C10082CAH: 500 nm, C10083CA/C10083CAH: 650 nm
*7: Entrance slit aperture size
*8: No condensation
pixels
μm
-
-
°C
°C
70 × 800
0.22
10 × 1000
0.11
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Output comparison (relative value)
* A/D count when constant light level enters fiber.
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Measurable optical power
C10082CAH
C10082MD
C10082CA
C10083CAH
C10083MD
(Typ. Ta=25 C)
C10083CA
WAVELENGTH (nm)
R
200
300
400
500
600
700
800
900
10
-5
10
-4
10
-3
10
-2
10
-1
10
0
10
1
1000
KACCB0168EA
KACCB0146EA
10
-15
10
-13
10
-11
10
-9
10
-7
LIGHT POWER * (W)
C10082CA (CCD TYPE)
* Light power incident on mini-spectrometer through slit
(
λ
=500 nm, integration time: 10 ms to 10000 ms)
C10082MD (CMOS TYPE)
Comparison of CCD type and CMOS type