• 參數(shù)資料
    型號: Am29LV640DU101RZE
    廠商: Advanced Micro Devices, Inc.
    英文描述: 64 Megabit (4 M x 16-Bit) CMOS 3.0 Volt-only Uniform Sector Flash Memory with VersatileI Control
    中文描述: 64兆位(4個M x 16位),3.0伏的CMOS只均勻部門閃光控制記憶與VersatileI
    文件頁數(shù): 28/57頁
    文件大小: 1467K
    代理商: AM29LV640DU101RZE
    September 20, 2002
    Am29LV640D/Am29LV641D
    27
    When the Embedded Erase algorithm is complete, the
    device returns to the read mode and addresses are no
    longer latched. The system can determine the status
    of the erase operation by using DQ7, DQ6, DQ2, or
    RY/BY#. Refer to the Write Operation Status section
    for information on these status bits.
    Any commands written during the chip erase operation
    are ignored. However, note that a
    hardware reset
    im-
    mediately terminates the erase operation. If that oc-
    curs, the chip erase command sequence should be
    reinitiated once the device has returned to reading
    array data, to ensure data integrity.
    Figure 4 illustrates the algorithm for the erase opera-
    tion. Refer to the Erase and Program Operations ta-
    bles in the AC Characteristics section for parameters,
    and Figure 17 section for timing diagrams.
    Sector Erase Command Sequence
    Sector erase is a six bus cycle operation. The sector
    erase command sequence is initiated by writing two
    unlock cycles, followed by a set-up command. Two ad-
    ditional unlock cycles are written, and are then fol-
    lowed by the address of the sector to be erased, and
    the sector erase command. Table 10 shows the ad-
    dress and data requirements for the sector erase com-
    mand sequence.
    The device does
    not
    require the system to preprogram
    prior to erase. The Embedded Erase algorithm auto-
    matically programs and verifies the entire memory for
    an all zero data pattern prior to electrical erase. The
    system is not required to provide any controls or tim-
    ings during these operations.
    After the command sequence is written, a sector erase
    time-out of 50 μs occurs. During the time-out period,
    additional sector addresses and sector erase com-
    mands may be written. Loading the sector erase buffer
    may be done in any sequence, and the number of sec-
    tors may be from one sector to all sectors. The time
    between these additional cycles must be less than 50
    μs, otherwise erasure may begin. Any sector erase
    address and command following the exceeded
    time-out may or may not be accepted. It is recom-
    mended that processor interrupts be disabled during
    this time to ensure all commands are accepted. The
    interrupts can be re-enabled after the last Sector
    Erase command is written.
    Any command other than
    Sector Erase or Erase Suspend during the
    time-out period resets the device to the read
    mode.
    The system must rewrite the command se-
    quence and any additional addresses and commands.
    The system can monitor DQ3 to determine if the sec-
    tor erase timer has timed out (See the section on DQ3:
    Sector Erase Timer.). The time-out begins from the ris-
    ing edge of the final WE# pulse in the command
    sequence.
    When the Embedded Erase algorithm is complete, the
    device returns to reading array data and addresses
    are no longer latched. The system can determine the
    status of the erase operation by reading DQ7, DQ6,
    DQ2, or RY/BY#. Note that while the Embedded Erase
    operation is in progress, the system can read data
    from the non-erasing sector. Refer to the Write Opera-
    tion Status section for information on these status bits.
    Once the sector erase operation has begun, only the
    Erase Suspend command is valid. All other com-
    mands are ignored. However, note that a
    hardware
    reset
    immediately
    terminates the erase operation. If
    that occurs, the sector erase command sequence
    should be reinitiated once the device has returned to
    reading array data, to ensure data integrity.
    Figure 4 illustrates the algorithm for the erase opera-
    tion. Refer to the Erase and Program Operations ta-
    bles in the AC Characteristics section for parameters,
    and Figure 17 section for timing diagrams.
    Erase Suspend/Erase Resume
    Commands
    The Erase Suspend command, B0h, allows the sys-
    tem to interrupt a sector erase operation and then read
    data from, or program data to, any sector not selected
    for erasure. This command is valid only during the
    sector erase operation, including the 50 μs time-out
    period during the sector erase command sequence.
    The Erase Suspend command is ignored if written dur-
    ing the chip erase operation or Embedded Program
    algorithm.
    When the Erase Suspend command is written during
    the sector erase operation, the device requires a max-
    imum of 20 μs to suspend the erase operation. How-
    ever, when the Erase Suspend command is written
    during the sector erase time-out, the device immedi-
    ately terminates the time-out period and suspends the
    erase operation.
    After the erase operation has been suspended, the
    device enters the erase-suspend-read mode. The sys-
    tem can read data from or program data to any sector
    not selected for erasure. (The device
    erase sus-
    pends
    all sectors selected for erasure.) Reading at
    any address within erase-suspended sectors pro-
    duces status information on DQ7
    DQ0. The system
    can use DQ7, or DQ6 and DQ2 together, to determine
    if a sector is actively erasing or is erase-suspended.
    Refer to the Write Operation Status section for infor-
    mation on these status bits.
    After an erase-suspended program operation is com-
    plete, the device returns to the erase-suspend-read
    mode. The system can determine the status of the
    program operation using the DQ7 or DQ6 status bits,
    just as in the standard word program operation.
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