參數(shù)資料
    型號: AM29LV116DT-70EC
    廠商: ADVANCED MICRO DEVICES INC
    元件分類: PROM
    英文描述: 16 Megabit (2 M x 8-Bit) CMOS 3.0 Volt-only Boot Sector Flash Memory
    中文描述: 2M X 8 FLASH 3V PROM, 70 ns, PDSO40
    封裝: MO-142CD, TSOP-40
    文件頁數(shù): 43/44頁
    文件大?。?/td> 863K
    代理商: AM29LV116DT-70EC
    42
    Am29LV116D
    REVISION SUMMARY
    Revision A (October 1997)
    First release.
    Revision B (October 1997)
    Global
    Deleted SO package from data sheet.
    Revision C (December 1997)
    Alternate CE# Controlled Erase/Program
    Operations
    Changed t
    CP
    from 45 to 35 ns on 80R and 90 speed
    options.
    Revision C+1 (January 1998)
    Global
    Changed data sheet status to Preliminary.
    Reset Command
    Deleted the last paragraph in this section.
    Revision C+2 (March 1998)
    Figure 2, In-System Sector Protect/Unprotect
    Algorithms (0.35 μm devices)
    In the sector protect algorithm, added a “Reset
    PLSCNT=1” box in the path from “Protect another sec-
    tor” back to setting up the next sector address.
    AC Characteristics
    Erase/Program Operations; Alternate CE# Controlled
    Erase/Program Operations:
    Corrected the notes refer-
    ence for t
    WHWH1
    and t
    WHWH2
    . These parameters are
    100% tested. Corrected the note reference for t
    VCS
    .
    This parameter is not 100% tested.
    Temporary Sector Unprotect Table
    Added note reference for t
    VIDR
    . This parameter is not
    100% tested.
    Figure 21, Sector Protect/Unprotect Timing
    Diagram
    A valid address is not required for the first write cycle;
    only the data 60h.
    Erase and Programming Performance
    In Note 2, the worst case endurance is now 1 million
    cycles.
    Revision C+3 (August 1998)
    Global
    Added 70R speed option, changed 80R speed option
    to 80.
    Distinctive Characteristics
    Changed process technology to 0.32 μm.
    Table 9, Command Definitions
    The CFI Query command is now included in the table.
    DC Characteristics
    Moved V
    CC
    max test condition for I
    CC
    specifications to
    notes.
    Figure 21, Sector Protect/Unprotect Timing
    Diagram
    Changed timing specifications in diagram to match
    those in the figure of In-System Sector Protect/Unpro-
    tect Algorithms.
    Revision D (January 1999)
    Distinctive Characteristics
    Added “20-year data retention at 125
    °
    C” bullet.
    Revision E (February 2, 2000)
    Global
    The process technology has changed to 0.23 μm, and
    is indicated in the part number by the “D” suffix. The 70
    ns speed option is now offered in the full voltage range
    instead of the regulated voltage range. The 70 ns
    devices are also now available in the industrial temper-
    ature range. The extended temperature range is no
    longer available. The 80 ns speed option has been
    deleted. All other parameters and functions remain
    unchanged.
    AC Characteristics—Figure 15. Program
    Operations Timing and Figure 16. Chip/Sector
    Erase Operations
    Deleted t
    GHWL
    and changed OE# waveform to start at
    high.
    Physical Dimensions
    Replaced figures with more detailed illustrations.
    Revision E+1 (November 7, 2000)
    Global
    Added table of contents. Deleted burn-in option in
    ordering information section.
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