參數(shù)資料
    型號: AM29F032B-120SC
    廠商: ADVANCED MICRO DEVICES INC
    元件分類: PROM
    英文描述: 32 Megabit (4 M x 8-Bit) CMOS 5.0 Volt-only, Uniform Sector Flash Memory
    中文描述: 4M X 8 FLASH 5V PROM, 120 ns, PDSO44
    封裝: MO-180AA, SOP-44
    文件頁數(shù): 35/39頁
    文件大?。?/td> 937K
    代理商: AM29F032B-120SC
    34
    Am29F032B
    ERASE AND PROGRAMMING PERFORMANCE
    Notes:
    1. Typical program and erase times assume the following conditions: 25
    °
    C, 5.0 V V
    CC
    , 1,000,000 cycles. Additionally,
    programming typicals assume checkerboard pattern.
    2.
    Under worst case conditions of 90°C, V
    CC
    = 4.5 V 1,000,000 cycles (4.75 V for -75).
    3. The typical chip programming time is considerably less than the maximum chip programming time listed, since most bytes
    program faster than the maximum byte program time listed. If the maximum byte program time given is exceeded, only then does
    the device set DQ5 = 1. See the section on DQ5 for further information.
    4. In the pre-programming step of the Embedded Erase algorithm, all bytes are programmed to 00h before erasure.
    5. System-level overhead is the time required to execute the four-bus-cycle sequence for programming. See Table 5 for further
    information on command definitions.
    6. The device has a minimum erase and program cycle endurance of 1,000,000 cycles.
    LATCHUP CHARACTERISTIC
    Note:
    Includes all pins except V
    CC
    . Test conditions: V
    CC
    = 5.0 Volt, one pin at a time.
    TSOP AND SO PIN CAPACITANCE
    Notes:
    1. Sampled, not 100% tested.
    2. Test conditions T
    A
    = 25
    °
    C, f = 1.0 MHz.
    DATA RETENTION
    Parameter
    Typ (Note 1)
    Max (Note 2)
    Unit
    Comments
    Sector Erase Time
    1
    8
    sec
    Excludes 00h programming prior to
    erasure (Note 4)
    Chip Erase Time
    64
    sec
    Byte Programming Time
    7
    300
    μs
    Excludes system-level overhead
    (Note 5)
    Chip Programming Time (Note 3)
    28.8
    86.4
    sec
    Description
    Min
    Max
    Input Voltage with respect to V
    SS
    on I/O pins
    –1.0 V
    V
    CC
    + 1.0 V
    V
    CC
    Current
    –100 mA
    +100 mA
    Parameter
    Symbol
    Parameter Description
    Test Conditions
    Min
    Max
    Unit
    C
    IN
    Input Capacitance
    V
    IN
    = 0
    6
    7.5
    pF
    C
    OUT
    Output Capacitance
    V
    OUT
    = 0
    8.5
    12
    pF
    C
    IN2
    Control Pin Capacitance
    V
    IN
    = 0
    7.5
    9
    pF
    Parameter
    Test Conditions
    Min
    Unit
    Minimum Pattern Data Retention Time
    150
    °
    C
    10
    Years
    125
    °
    C
    20
    Years
    相關(guān)PDF資料
    PDF描述
    AM29F032B 32 Megabit (4 M x 8-Bit) CMOS 5.0 Volt-only, Uniform Sector Flash Memory
    AM29F032B-120 32 Megabit (4 M x 8-Bit) CMOS 5.0 Volt-only, Uniform Sector Flash Memory
    AM29F032B-120EC 32 Megabit (4 M x 8-Bit) CMOS 5.0 Volt-only, Uniform Sector Flash Memory
    AM29F032B-120EE 32 Megabit (4 M x 8-Bit) CMOS 5.0 Volt-only, Uniform Sector Flash Memory
    AM29F032B-120EI 32 Megabit (4 M x 8-Bit) CMOS 5.0 Volt-only, Uniform Sector Flash Memory
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