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    參數(shù)資料
    型號: Am29F017B-120ECB
    廠商: Advanced Micro Devices, Inc.
    英文描述: GIGABASE 350 CAT5E PATCH 100 FT, NO BOOT BL 25PAK
    中文描述: 16兆位(2米× 8位)的CMOS 5.0伏只,統(tǒng)一部門快閃記憶體
    文件頁數(shù): 33/35頁
    文件大?。?/td> 443K
    代理商: AM29F017B-120ECB
    Am29F017B
    33
    P R E L I M I N A R Y
    ERASE AND PROGRAMMING PERFORMANCE
    Notes:
    1. Typical program and erase times assume the following conditions: 25
    °
    C, 5.0 V V
    CC
    , 1,000,000 cycles. Additionally,
    programming typicals assume checkerboard pattern.
    2.
    Under worst case conditions of 90°C, V
    CC
    = 4.5 V, 1,000,000 cycles.
    3. The typical chip programming time is considerably less than the maximum chip programming time listed, since most bytes
    program faster than the maximum byte program time listed. If the maximum byte program time given is exceeded, only then
    does the device set DQ5 = 1. See the section on DQ5 for further information.
    4. In the pre-programming step of the Embedded Erase algorithm, all bytes are programmed to 00h before erasure.
    5. System-level overhead is the time required to execute the four-bus-cycle sequence for programming. See Table 6 for further
    information on command definitions.
    6. The device has a guaranteed minimum erase and program cycle endurance of 1,000,000 cycles.
    LATCHUP CHARACTERISTICS
    Includes all pins except V
    CC
    . Test conditions: V
    CC
    = 5.0 Volt, one pin at a time.
    TSOP PIN CAPACITANCE
    Notes:
    1. Sampled, not 100% tested.
    2. Test conditions T
    A
    = 25
    °
    C, f = 1.0 MHz.
    DATA RETENTION
    Parameter
    Typ (Note 1)
    Max (Note 2)
    Unit
    Comments
    Sector Erase Time
    1
    8
    sec
    Excludes 00h programming prior to
    erasure (Note 4)
    Chip Erase Time
    32
    256
    sec
    Byte Programming Time
    7
    300
    μs
    Excludes system-level overhead
    (Note 5)
    Chip Programming Time (Note 3)
    14.4
    43.2
    sec
    Min
    Max
    Input Voltage with respect to V
    SS
    on I/O pins
    –1.0 V
    V
    CC
    + 1.0 V
    V
    CC
    Current
    –100 mA
    +100 mA
    Parameter
    Symbol
    Parameter Description
    Test Conditions
    Min
    Max
    Unit
    C
    IN
    Input Capacitance
    V
    IN
    = 0
    6
    7.5
    pF
    C
    OUT
    Output Capacitance
    V
    OUT
    = 0
    8.5
    12
    pF
    C
    IN2
    Control Pin Capacitance
    V
    IN
    = 0
    7.5
    9
    pF
    Parameter
    Test Conditions
    Min
    Unit
    Minimum Pattern Data Retention Time
    150
    °
    C
    10
    Years
    125
    °
    C
    20
    Years
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