參數(shù)資料
型號: AM29BDS643GT5MVAI
廠商: Spansion Inc.
英文描述: 64 Megabit (4 M x 16-Bit) CMOS 1.8 Volt-only Simultaneous Read/Write, Burst Mode Flash Memory
中文描述: 64兆位(4個(gè)M x 16位)的CMOS 1.8伏,只有同時(shí)讀/寫,突發(fā)模式閃存
文件頁數(shù): 49/49頁
文件大小: 382K
代理商: AM29BDS643GT5MVAI
May 8, 2006 25692A2
Am29BDS643G
47
D A T A S H E E T
REVISION SUMMARY
Revision A (November 1, 2001)
Initial release.
Revision A+1 (November 9, 2001)
Program Command Sequence;
Table 10, Command Definitions
Deleted references to unlock bypass chip and sector
erase commands.
AC Characteristics, Erase and Program Operations
Corrected t
WHWH1
and t
WHWH2
to match same specifi-
cations elsewhere in document.
Physical Dimensions
Replaced drawing with updated version.
Revision A2 (May 8, 2006)
Added migration/obsolescence information.
Colophon
The products described in this document are designed, developed and manufactured as contemplated for general use, including without limita-
tion, ordinary industrial use, general office use, personal use, and household use, but are not designed, developed and manufactured as con-
templated (1) for any use that includes fatal risks or dangers that, unless extremely high safety is secured, could have a serious effect to the
public, and could lead directly to death, personal injury, severe physical damage or other loss (i.e., nuclear reaction control in nuclear facility,
aircraft flight control, air traffic control, mass transport control, medical life support system, missile launch control in weapon system), or (2) for
any use where chance of failure is intolerable (i.e., submersible repeater and artificial satellite). Please note that Spansion LLC will not be liable
to you and/or any third party for any claims or damages arising in connection with above-mentioned uses of the products. Any semiconductor
devices have an inherent chance of failure. You must protect against injury, damage or loss from such failures by incorporating safety design
measures into your facility and equipment such as redundancy, fire protection, and prevention of over-current levels and other abnormal operating
conditions. If any products described in this document represent goods or technologies subject to certain restrictions on export under the Foreign
Exchange and Foreign Trade Law of Japan, the US Export Administration Regulations or the applicable laws of any other country, the prior au-
thorization by the respective government entity will be required for export of those product.
Copyright 2001–2006 Advanced Micro Devices, Inc. All rights reserved.
AMD, the AMD logo, and combinations thereof are registered trademarks of Advanced Micro Devices, Inc.
Product names used in this publication are for identification purposes only and may be trademarks of their respective companies.
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