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  • 參數(shù)資料
    型號(hào): AM28F010A-150JEB
    廠商: ADVANCED MICRO DEVICES INC
    元件分類(lèi): PROM
    英文描述: 1 Megabit (128 K x 8-Bit) CMOS 12.0 Volt, Bulk Erase Flash Memory with Embedded Algorithms
    中文描述: 128K X 8 FLASH 12V PROM, 150 ns, PQCC32
    封裝: PLASTIC, LCC-32
    文件頁(yè)數(shù): 24/35頁(yè)
    文件大?。?/td> 464K
    代理商: AM28F010A-150JEB
    24
    Am28F010A
    SWITCHING TEST WAVEFORMS
    SWITCHING CHARACTERISTICS over operating range, unless otherwise specified
    AC Characteristics—Read-Only Operations
    Notes:
    1. Guaranteed by design; not tested.
    2. Not 100% tested.
    Parameter
    Symbols
    Am28F010A Speed Options
    JEDEC
    Standard
    Parameter Description
    -70
    -90
    -120
    -150
    -200
    Unit
    t
    AVAV
    t
    RC
    Read Cycle Time (Note 3)
    Min
    70
    90
    120
    150
    200
    ns
    t
    ELQV
    t
    CE
    Chip Enable Access Time
    Max
    70
    90
    120
    150
    200
    ns
    t
    AVQV
    t
    ACC
    Address Access Time
    Max
    70
    90
    120
    150
    200
    ns
    t
    GLQV
    t
    OE
    Output Enable Access Time
    Max
    35
    35
    50
    55
    55
    ns
    t
    ELQX
    t
    LZ
    Chip Enable to Output in Low Z (Note 3)
    Min
    0
    0
    0
    0
    0
    ns
    t
    EHQZ
    t
    DF
    Chip Disable to Output in High Z (Note 1)
    Max
    20
    20
    30
    35
    35
    ns
    t
    GLQX
    t
    OLZ
    Output Enable to Output in Low Z (Note 3)
    Min
    0
    0
    0
    0
    0
    ns
    t
    GHQZ
    t
    DF
    Output Disable to Output in High Z (Note 3)
    Max
    20
    20
    30
    35
    35
    ns
    t
    AXQX
    t
    OH
    Output Hold Time From First Address, CE
    #
    ,
    or OE
    #
    change (Note 3)
    Min
    0
    0
    0
    0
    0
    ns
    t
    VCS
    V
    CC
    Set-up Time to Valid Read (Note 3)
    Min
    50
    50
    50
    50
    50
    ns
    16778D-17
    3 V
    0 V
    Input
    Output
    1.5 V
    1.5 V
    Test Points
    AC Testing for -70 devices: Inputs are driven at 3.0 V for a
    logic “1” and 0 V for a logic “0”. Input pulse rise and fall times
    are
    10 ns.
    2.4 V
    0.45 V
    Input
    Output
    Test Points
    2.0 V
    2.0 V
    0.8 V
    0.8 V
    AC Testing (all speed options except -70): Inputs are driven at
    2.4 V for a logic “1” and 0.45 V for a logic “0”. Input pulse rise
    and fall times are
    10 ns.
    相關(guān)PDF資料
    PDF描述
    AM28F010A-200JEB 1 Megabit (128 K x 8-Bit) CMOS 12.0 Volt, Bulk Erase Flash Memory with Embedded Algorithms
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    AM28F020-120EIB Rectangular Connector; Body Material:Polyester; Series:8016; Number of Contacts:38; Contact Material:Phosphor Bronze; Contact Plating:Gold Over Nickel; Gender:Male; Leaded Process Compatible:Yes; Peak Reflow Compatible (260 C):Yes
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    相關(guān)代理商/技術(shù)參數(shù)
    參數(shù)描述
    AM28F010A-150JI 制造商:AMD 制造商全稱(chēng):Advanced Micro Devices 功能描述:1 Megabit (128 K x 8-Bit) CMOS 12.0 Volt, Bulk Erase Flash Memory with Embedded Algorithms
    AM28F010A-150JIB 制造商:AMD 制造商全稱(chēng):Advanced Micro Devices 功能描述:1 Megabit (128 K x 8-Bit) CMOS 12.0 Volt, Bulk Erase Flash Memory with Embedded Algorithms
    AM28F010A-150LE 制造商:未知廠家 制造商全稱(chēng):未知廠家 功能描述:x8 Flash EEPROM
    AM28F010A-150LEB 制造商:未知廠家 制造商全稱(chēng):未知廠家 功能描述:x8 Flash EEPROM
    AM28F010A-150PC 制造商:AMD 制造商全稱(chēng):Advanced Micro Devices 功能描述:1 Megabit (128 K x 8-Bit) CMOS 12.0 Volt, Bulk Erase Flash Memory with Embedded Algorithms