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參數資料
| 型號： | AM27C4096-100DIB |
| 廠商： | ADVANCED MICRO DEVICES INC |
| 元件分類： | PROM |
| 英文描述： | TV 15C 14#20 1#16 SKT PLUG |
| 中文描述： | 256K X 16 UVPROM, 100 ns, CDIP40 |
| 封裝： | WINDOWED, CERAMIC, DIP-40 |
| 文件頁數： | 9/12頁 |
| 文件大?。?/td> | 165K |
| 代理商： | AM27C4096-100DIB |
Am27C4096
9
TEST CONDITIONS
Table 1.
Test Specifications
SWITCHING TEST WAVEFORM
KEY TO SWITCHING WAVEFORMS
2.7 k
C
L
6.2 k
5.0 V
Device
Under
Test
11408F-7
Figure 3.
Test Setup
Note:
Diodes are IN3064 or equivalents.
Test Condition
All
Unit
Output Load
1 TTL gate
Output Load Capacitance, C
L
(including jig capacitance)
100
pF
Input Rise and Fall Times
≤
20
ns
Input Pulse Levels
0.45–2.4
V
Input timing measurement reference
levels
0.8, 2.0
V
Output timing measurement
reference levels
0.8, 2.0
V
2.4 V
0.45 V
Input
Output
Test Points
2.0 V
2.0 V
0.8 V
0.8 V
11408F-8
Note:
For C
L
= 100 pF
KS000010-PAL
WAVEFORM
INPUTS
OUTPUTS
Steady
Changing from H to L
Changing from L to H
Don’t Care, Any Change Permitted
Changing, State Unknown
Does Not Apply
Center Line is High Impedance State (High Z)
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