參數(shù)資料
型號(hào)： AK2574
廠商： Asahi Kasei Microsystems Co.,Ltd
英文描述： 156M Laser Diode Driver + APC for Burst Mode
中文描述： 1.56激光二極管驅(qū)動(dòng)器apc的突發(fā)模式
文件頁(yè)數(shù)： 24/30頁(yè)
文件大?。?/td> 248K
代理商： AK2574
ASAHI KASEI
[AK2574]
<MS0266-E-00>
-24-
2003/12
5.2.6
The SDA pin is normally pulled high with 4.7k to 10k
Ω
. Data on the SDA pin may change only during SCL low time
period. Data changes during SCL high periods will indicate a start or stop condition.
Data Change
SDA
SCL
Data
Stable
Data
Change
5.2.7
Start Condition: A high-to-low transition of SDA with SCL high is a start condition that must precede any other
command.
Stop Condition: A low-to-high transition of SDA with SCL high is a stop condition.
Start /Stop Condition
SDA
SCL
START
STOP
5.3 EEPROM
EEPROM memory map is shown in Table 5-3, 5-4 and 5-5.
EEPROM access is limited with WP pin and Operation mode (refer toTable 6-1, for more information).
WP = “L”: Full access
WP = “H”: User area only with read only
(Note) The AKM factory adjusted data are stored in advance at address (Device Address = A6h, Address = 60h) for
the offset of the on-chip temperature sensor. If such excess temperature stress is tobe applied tothis device
which exceeds a guaranteed EEPROM data retention conditions ( for 10 years at 85
the pre-determined value in advance and tore-write the same data back into EEPROM after an exposure to
the excess temperature environment. Even if the exposure time is shorter than the retention time, any
accelerated temperature stress tests (such as baking) are performed, it is recommended to read the pre-set
data first and to re-write it after the tests.
℃
), it is important to read
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