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參數(shù)資料
| 型號(hào)： | ADM208E |
| 廠商： | Analog Devices, Inc. |
| 英文描述： | RS-232 Line Drivers/Receivers(15kV ESD保護(hù),RS-232線驅(qū)動(dòng)器/接收器) |
| 中文描述： | RS - 232線驅(qū)動(dòng)器/接收器（15kV的ESD保護(hù)和RS - 232線驅(qū)動(dòng)器/接收器） |
| 文件頁(yè)數(shù)： | 11/16頁(yè) |
| 文件大?。?/td> | 225K |
| 代理商： | ADM208E |
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ADM206E/ADM207E/ADM208E/ADM211E/ADM213E
REV. B
–11–
R1
R2
C1
DEVICE
UNDER TEST
HIGH
VOLTAGE
GENERATOR
ESD TEST METHOD
H. BODY MIL-STD883B
IEC1000-4-2
R2
1.5k
V
330
V
C1
100pF
150pF
Figure 25. ESD Test Standards
100
I
P
90
36.8
10
t
DL
t
RL
TIME t
Figure 26. Human Body Model ESD Current Waveform
100
I
P
90
10
TIME t
30ns
60ns
0.1 TO 1ns
Figure 27. IEC1000-4-2 ESD Current Waveform
The ADM2xxE family of products are tested using both the
above mentioned test methods. All pins are tested with respect
to all other pins as per the MIL-STD-883B specification. In
addition all I-O pins are tested as per the IEC test specification.
The products were tested under the following conditions:
(a) Power-On—Normal Operation
(b) Power-On—Shutdown Mode
(c) Power-Off
There are four levels of compliance defined by IEC1000-4-2.
The ADM2xxE family of products meet the most stringent
compliance level for both contact and for air-gap discharge. This
means that the products are able to withstand contact discharges in
excess of 8 kV and air-gap discharges in excess of 15 kV.
Table IV. IEC1000-4-2 Compliance Levels
Contact Discharge
kV
2
4
6
8
Air Discharge
kV
2
4
8
15
Level
1
2
3
4
Table V. ADM2xxE ESD Test Results
ESD Test Method
I-O Pins
±
15 kV
Other Pins
±
2.5 kV
MIL-STD-883B
IEC1000-4-2
Contact
Air
±
8 kV
±
15 kV
FAST TRANSIENT BURST TESTING (IEC1000-4-4)
IEC1000-4-4 (previously 801-4) covers electrical fast-transient/
burst (EFT) immunity. Electrical fast transients occur as a
result of arcing contacts in switches and relays. The tests simu-
late the interference generated when for example a power relay
disconnects an inductive load. A spark is generated due to the
well known back EMF effect. In fact the spark consists of a
burst of sparks as the relay contacts separate. The voltage appear-
ing on the line, therefore, consists of a bust of extremely fast tran-
sient impulses. A similar effect occurs when switching on
fluorescent lights.
The fast transient burst test defined in IEC1000-4-4 simulates
this arcing and its waveform is illustrated in Figure 28. It con-
sists of a burst of 2.5 kHz to 5 kHz transients repeating at
300 ms intervals. It is specified for both power and data lines.
300ms
15ms
t
V
5ns
0.2/0.4ms
50ns
V
t
Figure 28. IEC1000-4-4 Fast Transient Waveform
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