TA = 25°C, unless other" />
參數(shù)資料
型號(hào): ADM202EAN
廠商: Analog Devices Inc
文件頁(yè)數(shù): 11/16頁(yè)
文件大?。?/td> 0K
描述: IC TX/RX RS-232 5V 15KV 16DIP
標(biāo)準(zhǔn)包裝: 25
類型: 收發(fā)器
驅(qū)動(dòng)器/接收器數(shù): 2/2
規(guī)程: RS232
電源電壓: 4.5 V ~ 5.5 V
安裝類型: 通孔
封裝/外殼: 16-DIP(0.300",7.62mm)
供應(yīng)商設(shè)備封裝: 16-PDIP
包裝: 管件
ADM202E/ADM1181A
Rev. C | Page 4 of 16
ABSOLUTE MAXIMUM RATINGS
TA = 25°C, unless otherwise noted.
Table 2.
Parameter
Values
VCC
0.3 V to +6 V
V+
(VCC 0.3 V) to +14 V
V–
+0.3 V to 14 V
Input Voltages
TIN
0.3 V to (V+, +0.3 V)
RIN
±30 V
Output Voltages
TOUT
±15 V
ROUT
–0.3 V to (VCC + 0.3 V)
Short-Circuit Duration
TOUT
Continuous
Power Dissipation N-16
450 mW
(Derate 6 mW/°C Above 50°C)
θJA, Thermal Impedance
117°C/W
Power Dissipation R-16
450 mW
(Derate 6 mW/°C Above 50°C)
θJA, Thermal Impedance
158°C/W
Power Dissipation RU-16
500 mW
(Derate 6 mW/°C Above 50°C)
θJA, Thermal Impedance
158°C/W
Operating Temperature Range
Industrial (A Version)
–40°C to +85°C
Storage Temperature Range
–65°C to +150°C
Lead Temperature (Soldering, 10 sec)
300°C
ESD Rating (MIL-STD-883B) (I/O Pins)
±15 kV
ESD Rating (IEC1000-4-2 Air) (I/O Pins)
±15 kV
ESD Rating (IEC1000-4-2 Contact)
(I/O Pins)
±8 kV
EFT Rating (IEC1000-4-4) (I/O Pins)
±2 kV
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to
absolute maximum rating conditions for extended periods may
affect device reliability.
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
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