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REV. C
–8–
ADG508F/ADG509F/ADG528F
Test Circuits
I
DS
S
R
ON
= V
1
/I
DS
V1
V
S
D
Test Circuit 1. On Resistance
V
S
I
S
(OFF)
V
D
S1
S2
S8
V
SS
V
DD
V
SS
V
DD
+0.8V
D
EN
A
Test Circuit 2. I
S
(OFF)
V
D
S1
S2
S8
V
S
V
SS
V
DD
I
D
(OFF)
V
SS
V
DD
+0.8V
D
EN
A
Test Circuit 3. I
D
(OFF)
I
D
(ON)
V
D
S1
S8
V
S
V
SS
V
DD
V
SS
V
DD
+2.4V
D
EN
A
S2
Test Circuit 4. I
D
(ON)
V
D
S1
S2
S8
V
S
V
SS
V
DD
V
SS
V
DD
+0.8V
D
EN
A
Test Circuit 5. Input Leakage Current
(with Overvoltage)
A2
A1
A0
EN
RS
V
S
0V
0V
V
SS
V
DD
D
0V
A
* SIMILAR CONNECTION FOR ADG508F/ADG509F
GND
WR
ADG528F
*
S1
S8
Test Circuit 6. Input Leakage Current
(with Power Supplies OFF)
3V
50%
V
OUT
t
TRANSITION
90%
90%
t
TRANSITION
ADDRESS
DRIVE (V
IN
)
50%
A2
A1
A0
V
OUT
V
SS
V
DD
D
V
S1
* SIMILAR CONNECTION FOR ADG508F/ADG509F
EN
RS
GND
WR
ADG528F
*
S1
S8
S2–S7
V
IN
+2.4V
50
V
V
S8
R
L
1M
V
C
35pF
V
SS
V
DD
Test Circuit 7. Switching Time of Multiplexer, t
TRANSITION