參數(shù)資料
型號(hào): ADG1204
廠商: Analog Devices, Inc.
英文描述: 2 pF Off Capacitance, 1 pC Charge Injection, +-15 V/12 V 4:1 iCMOS Multiplexer
中文描述: 2公積金關(guān)閉電容,1件電荷注入,-15 V/12號(hào)V 4:1 iCMOS工藝復(fù)用器
文件頁數(shù): 13/16頁
文件大?。?/td> 453K
代理商: ADG1204
Preliminary Technical Data
ADG1204
TEST CIRCUITS
Rev. PrD | Page 13 of 16
I
DS
S
D
V
S
0
V
S
D
V
S
A
A
V
D
I
S
(OFF)
I
D
(OFF)
0
S
D
A
V
D
I
D
(ON)
NC
NC = No Connect
0
Figure 21. Test Circuit 1—On Resistance
Figure 22. Test Circuit 2—Off Leakage
Figure 23. Test Circuit 3—On Leakage
V
S
S1
S2
D
GND
C
35pF
R
L
50
V
OUT
50%
50%
90%
90%
ADDRESS
DRIVE (V
IN
)
V
OUT
A0
A1
S4
S3
V
S1
V
S4
EN
+2.4V
0V
3V
t
TRANSITION
t
TRANSITION
V
DD
0.1
μ
F
V
SS
V
DD
V
SS
0.1
μ
F
0
Figure 24. Test Circuit 4—Address to Output Switching Times
ADDRESS
DRIVE (V
IN
)
V
OUT
V
S
S1
S2
D
GND
C
35pF
R
L
50
50
V
OUT
A0
A1
S4
S3
V
S1
EN
+2.4V
V
DD
0.1
μ
F
V
SS
V
DD
V
SS
0.1
μ
F
0
t
BBM
80%
80%
0V
3V
Figure 25. Test Circuit 5—Break-before-Make Time
Delay.
ENABLE
DRIVE (V
IN
)
S1
S2
D
GND
C
35pF
R
L
50
V
OUT
A0
A1
S4
S3
V
S
EN
V
DD
0.1
μ
F
V
SS
V
DD
V
SS
0.1
μ
F
V
S
50
0
t
OFF
(EN)
t
ON
(EN)
50%
50%
0.9V0
0.9V0
OUTPUT
0V
3V
V0
0V
Figure 26. Test Circuit 6—Enable to Output Switching Delay
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