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參數(shù)資料
| 型號： | ADG1201BRJZ-REEL7 |
| 廠商： | Analog Devices Inc |
| 文件頁數(shù)： | 11/16頁 |
| 文件大?。?/td> | 0K |
| 描述： | IC SWITCH SPST NO SOT23 |
| 標(biāo)準(zhǔn)包裝： | 3,000 |
| 系列： | iCMOS® |
| 功能： | 開關(guān) |
| 電路： | 1 x SPST - NO |
| 導(dǎo)通狀態(tài)電阻： | 475 歐姆 |
| 電壓電源： | 單/雙電源 |
| 電壓 - 電源，單路/雙路(±)： | 5V，±2.5 V ~ 8.25 V |
| 電流 - 電源： | 60µA |
| 工作溫度： | -40°C ~ 125°C |
| 安裝類型： | 表面貼裝 |
| 封裝/外殼： | SOT-23-6 |
| 供應(yīng)商設(shè)備封裝： | SOT-23-6 |
| 包裝： | 帶卷 (TR) |
ADG1201/ADG1202
Rev. 0 | Page 4 of 16
SINGLE SUPPLY
VDD = 12 V ± 10%, VSS = 0 V, GND = 0 V, unless otherwise noted.
Table 2.
B Version1
Parameter
25°C
40°C to
+85°C
40°C to
+125°C
Unit
Test Conditions/Comments
ANALOG SWITCH
Analog Signal Range
0 V to VDD
V
On Resistance (RON)
300
Ω typ
VDD = 10.8 V, VSS = 0 V
475
567
625
Ω max
On Resistance Flatness (RFLAT(ON))
60
Ω typ
VS = 3 V, 6 V, and 9 V, IS = 1 mA
LEAKAGE CURRENTS
VDD = 13.2 V, VSS = 0 V
Source Off Leakage, IS (Off )
±0.006
nA typ
±0.1
±0.6
±1
nA max
Drain Off Leakage, ID (Off )
±0.006
nA typ
±0.1
±0.6
±1
nA max
Channel On Leakage, ID, IS (On)
±0.04
nA typ
±0.15
±0.6
±1
nA max
DIGITAL INPUTS
Input High Voltage, VINH
2.0
V min
Input Low Voltage, VINL
0.8
V max
Input Current, IINL or IINH
0.001
μA typ
VIN = VINL or VINH
±0.1
μA max
Digital Input Capacitance, CIN
3
pF typ
DYNAMIC CHARACTERISTICS2
tON
190
ns typ
RL = 300 Ω, CL = 35 pF
250
295
340
ns max
tOFF
120
ns typ
RL = 300 Ω, CL = 35 pF
155
190
210
ns max
Charge Injection
0.8
pC typ
Off Isolation
80
dB typ
RL = 50 Ω, CL = 5 pF, f = 1 MHz;
see Figure 23
3 dB Bandwidth
520
MHz typ
CS (Off )
2.7
pF typ
VS = 6 V, f = 1 MHz
3.3
pF max
VS = 6 V, f = 1 MHz
CD (Off )
3.1
pF typ
VS = 6 V, f = 1 MHz
3.6
pF max
VS = 6 V, f = 1 MHz
CD, CS (On)
5.3
pF typ
VS = 6 V, f = 1 MHz
6.3
pF max
VS = 6 V, f = 1 MHz
POWER REQUIREMENTS
VDD = 13.2 V
IDD
0.001
μA typ
Digital inputs = 0 V or VDD
1.0
μA max
IDD
60
μA typ
Digital inputs = 5 V
95
μA max
VDD
+5/+16.5
V min/max
VSS = 0 V, GND = 0 V
1 Temperature range for B version is
40°C to +125°C.
2 Guaranteed by design, not subject to production test.
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