參數(shù)資料
型號(hào): AD5245BRJZ10-RL7
廠商: Analog Devices Inc
文件頁(yè)數(shù): 4/20頁(yè)
文件大小: 0K
描述: IC DGTL POT 256POS SOT-23-8 T/R
標(biāo)準(zhǔn)包裝: 3,000
接片: 256
電阻(歐姆): 10k
電路數(shù): 1
溫度系數(shù): 標(biāo)準(zhǔn)值 45 ppm/°C
存儲(chǔ)器類(lèi)型: 易失
接口: I²C(設(shè)備位址)
電源電壓: 2.7 V ~ 5.5 V
工作溫度: -40°C ~ 125°C
安裝類(lèi)型: 表面貼裝
封裝/外殼: SOT-23-8
供應(yīng)商設(shè)備封裝: SOT-23-8
包裝: 帶卷 (TR)
AD5245
Rev. B | Page 12 of 20
TEST CIRCUITS
Figure 28 to Figure 34 illustrate the test circuits that define the test conditions used in the product specification tables (Table 1 through Table 3).
VMS
A
W
B
DUT
V+
V+ = VDD
1LSB = V+/2N
03
436
-027
Figure 28. Test Circuit for Potentiometer Divider Nonlinearity Error
(INL, DNL)
NO CONNECT
IW
VMS
A W
B
DUT
03
43
6-
02
8
Figure 29. Test Circuit for Resistor Position Nonlinearity Error
(Rheostat Operation; R-INL, R-DNL)
VMS2
VMS1
VW
A
W
B
DUT
IW = VDD/RNOMINAL
RW = [VMS1 – VMS2]/IW
03
43
6-
0
2
9
Figure 30. Test Circuit for Wiper Resistance
VMS%
DD%
PSS (%/%) =
V+ = VDD ±10%
PSRR (dB) = 20 log
MS
DD
(
)
VDD
VA
VMS
A
W
B
V+
V
03
436
-0
3
0
Figure 31. Test Circuit for Power Supply Sensitivity (PSS, PSSR)
+15V
–15V
W
A
2.5V
B
VOUT
OFFSET
GND
DUT
AD8610
VIN
0
3
4
36-
03
1
Figure 32. Test Circuit for Gain vs. Frequency
W
B
GND TO VDD
DUT
ISW
CODE = 0x00
RSW =
0.1V
ISW
0.1V
0
343
6-
03
2
Figure 33. Test Circuit for Incremental On Resistance
W
B
VCM
ICM
A
NC
GND
NC
VDD
DUT
NC = NO CONNECT
0
343
6-
03
3
Figure 34. Test Circuit for Common-Mode Leakage Current
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